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contributor authorS.-M. Lee
contributor authorD. S. Stone
date accessioned2017-05-08T23:38:07Z
date available2017-05-08T23:38:07Z
date copyrightJune, 1992
date issued1992
identifier issn1528-9044
identifier otherJEPAE4-26129#118_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/110064
description abstractRoom temperature, displacement-controlled tensile test and displacement-controlled tension/compression fatigue tests were performed on as-cast specimens of eutectic Pb-Sn solder with lamellar microstructure. A range of strain rates were used to identify how failure varies with strain rate. Under tensile loading at high strain rate (6.7 × 10−2 /s) failure was observed after about 20 percent strain. There was evidence of shear localization, and failure was transgranular with a dimpled fracture surface. The low strain rate (6.7 × 10−6 /s ) tensile specimen failed by cavitation. This cavitation coincided with sliding at boundaries between colonies of the eutectic (grain boundaries); there was little evidence of sliding in the high strain rate specimen. Two behaviors were observed in the fatigue tests. At low frequency and high strain range (2 × 10−3 /s, 4 percent, Nf ≈ 300−1000) numerous intergranular cracks initiated at the surface, eventually linking up and propagating along grain boundaries to the interior. What appeared to be fatigue striations were found on the crack face. At high frequency and low strains (>0.1/s, <1 percent) transgranular failure dominated.
publisherThe American Society of Mechanical Engineers (ASME)
titleDeformation and Fracture of Pb-Sn-Eutectic Under Tensile and Fatigue Loading
typeJournal Paper
journal volume114
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2906407
journal fristpage118
journal lastpage121
identifier eissn1043-7398
keywordsDeformation
keywordsFatigue
keywordsFracture (Process)
keywordsFailure
keywordsFatigue testing
keywordsDisplacement
keywordsGrain boundaries
keywordsCavitation
keywordsShear (Mechanics)
keywordsCompression
keywordsTemperature
keywordsSolders AND Tension
treeJournal of Electronic Packaging:;1992:;volume( 114 ):;issue: 002
contenttypeFulltext


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