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    Thermal Stress Analysis of Pin Grid Array Structures: Module and Card Interactions

    Source: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 003::page 322
    Author:
    P. A. Engel
    ,
    J. R. Webb
    DOI: 10.1115/1.2905458
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: While primary thermal stress analysis of pin grid arrays considers a nonflexible card and module delineating the structure, in this paper we consider the stress relief (resulting in a “secondary” force system) afforded by bending and stretching of the delineating plates. The primary axial force F, plate moments, M1 , M2 , and shear V are considered acting in radial planes, and the secondary pin forces P are solved by stipulating compatibility of deformations at the two pin ends. A collocation technique is used to evaluate the plate equations in polar symmetry. The contributions of transverse plate compliances, and in-plane compliances are evaluated numerically for a 50 mm ceramic module, and compared with known experimental force measurements.
    keyword(s): Thermal stresses , Force , Deformation , Ceramics , Stress , Shear (Mechanics) , Plates (structures) , Equations AND Force measurement ,
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      Thermal Stress Analysis of Pin Grid Array Structures: Module and Card Interactions

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/110050
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    contributor authorP. A. Engel
    contributor authorJ. R. Webb
    date accessioned2017-05-08T23:38:06Z
    date available2017-05-08T23:38:06Z
    date copyrightSeptember, 1992
    date issued1992
    identifier issn1528-9044
    identifier otherJEPAE4-26132#322_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/110050
    description abstractWhile primary thermal stress analysis of pin grid arrays considers a nonflexible card and module delineating the structure, in this paper we consider the stress relief (resulting in a “secondary” force system) afforded by bending and stretching of the delineating plates. The primary axial force F, plate moments, M1 , M2 , and shear V are considered acting in radial planes, and the secondary pin forces P are solved by stipulating compatibility of deformations at the two pin ends. A collocation technique is used to evaluate the plate equations in polar symmetry. The contributions of transverse plate compliances, and in-plane compliances are evaluated numerically for a 50 mm ceramic module, and compared with known experimental force measurements.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleThermal Stress Analysis of Pin Grid Array Structures: Module and Card Interactions
    typeJournal Paper
    journal volume114
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2905458
    journal fristpage322
    journal lastpage328
    identifier eissn1043-7398
    keywordsThermal stresses
    keywordsForce
    keywordsDeformation
    keywordsCeramics
    keywordsStress
    keywordsShear (Mechanics)
    keywordsPlates (structures)
    keywordsEquations AND Force measurement
    treeJournal of Electronic Packaging:;1992:;volume( 114 ):;issue: 003
    contenttypeFulltext
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