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    Thermal Stress Analysis of Pin Grid Array Structures: Pin and Solder Joint Problems

    Source: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 003::page 314
    Author:
    Peter A. Engel
    ,
    Kee Rong Wu
    DOI: 10.1115/1.2905457
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The role of the solder joint as an elastic foundation is investigated first for structural analysis of the pin. Failure mechanisms are discussed. For various pin cross sections, guidelines for computing the foundation constant by analytical and finite element methods are established. Exact expression are derived for the pin stress. The solder stress (radial pressure or tension) is found by an approximate contact analysis. Elasto-plastic pin analysis, for excessive thermal mismatch, is effected by an iterative method. The variation of the plastic domain is examined for various size and material parameters. Axial forces in the presence and absence of pin plasticity are investigated, and the overall effect on the PGA is discussed.
    keyword(s): Thermal stresses , Solder joints , Stress , Cross section (Physics) , Tension , Finite element methods , Failure mechanisms , Iterative methods , Force , Pressure , Plasticity , Structural analysis AND Solders ,
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      Thermal Stress Analysis of Pin Grid Array Structures: Pin and Solder Joint Problems

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/110049
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    • Journal of Electronic Packaging

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    contributor authorPeter A. Engel
    contributor authorKee Rong Wu
    date accessioned2017-05-08T23:38:06Z
    date available2017-05-08T23:38:06Z
    date copyrightSeptember, 1992
    date issued1992
    identifier issn1528-9044
    identifier otherJEPAE4-26132#314_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/110049
    description abstractThe role of the solder joint as an elastic foundation is investigated first for structural analysis of the pin. Failure mechanisms are discussed. For various pin cross sections, guidelines for computing the foundation constant by analytical and finite element methods are established. Exact expression are derived for the pin stress. The solder stress (radial pressure or tension) is found by an approximate contact analysis. Elasto-plastic pin analysis, for excessive thermal mismatch, is effected by an iterative method. The variation of the plastic domain is examined for various size and material parameters. Axial forces in the presence and absence of pin plasticity are investigated, and the overall effect on the PGA is discussed.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleThermal Stress Analysis of Pin Grid Array Structures: Pin and Solder Joint Problems
    typeJournal Paper
    journal volume114
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2905457
    journal fristpage314
    journal lastpage321
    identifier eissn1043-7398
    keywordsThermal stresses
    keywordsSolder joints
    keywordsStress
    keywordsCross section (Physics)
    keywordsTension
    keywordsFinite element methods
    keywordsFailure mechanisms
    keywordsIterative methods
    keywordsForce
    keywordsPressure
    keywordsPlasticity
    keywordsStructural analysis AND Solders
    treeJournal of Electronic Packaging:;1992:;volume( 114 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
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