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    A New Method for Measuring Adhesion Strength of IC Molding Compounds

    Source: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 004::page 407
    Author:
    Asao Nishimura
    ,
    Isao Hirose
    ,
    Naotaka Tanaka
    DOI: 10.1115/1.2905473
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Adhesion strength evaluation of molding compounds is a critical issue in structural design and material selection for IC plastic packages. However, since conventional adhesion tests can only give apparent adhesion strengths, which include the effect of residual stress, their results cannot be used for design purposes. This paper proposes a new strength evaluation method which can experimentally separate residual stress from adhesion strength. In this method, three-point bending tests of ENF specimens are performed in both directions. Residual stress is then cancelled by simply averaging the apparent strengths for both directions. The method’s validity is verified by experiments and stress analyses of specimens composed of an IC molding compound and Alloy 42 lead frame material. Adhesion strength is expressed in terms of the stress intensity factor of the interface crack. It is confirmed that constant strengths can be obtained independently of specimen dimensions.
    keyword(s): Molding , Stress , Structural frames , Alloys , Dimensions , Structural design , Stress analysis (Engineering) , Fracture (Materials) , Design AND Evaluation methods ,
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      A New Method for Measuring Adhesion Strength of IC Molding Compounds

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/110026
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    • Journal of Electronic Packaging

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    contributor authorAsao Nishimura
    contributor authorIsao Hirose
    contributor authorNaotaka Tanaka
    date accessioned2017-05-08T23:38:04Z
    date available2017-05-08T23:38:04Z
    date copyrightDecember, 1992
    date issued1992
    identifier issn1528-9044
    identifier otherJEPAE4-26133#407_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/110026
    description abstractAdhesion strength evaluation of molding compounds is a critical issue in structural design and material selection for IC plastic packages. However, since conventional adhesion tests can only give apparent adhesion strengths, which include the effect of residual stress, their results cannot be used for design purposes. This paper proposes a new strength evaluation method which can experimentally separate residual stress from adhesion strength. In this method, three-point bending tests of ENF specimens are performed in both directions. Residual stress is then cancelled by simply averaging the apparent strengths for both directions. The method’s validity is verified by experiments and stress analyses of specimens composed of an IC molding compound and Alloy 42 lead frame material. Adhesion strength is expressed in terms of the stress intensity factor of the interface crack. It is confirmed that constant strengths can be obtained independently of specimen dimensions.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleA New Method for Measuring Adhesion Strength of IC Molding Compounds
    typeJournal Paper
    journal volume114
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2905473
    journal fristpage407
    journal lastpage412
    identifier eissn1043-7398
    keywordsMolding
    keywordsStress
    keywordsStructural frames
    keywordsAlloys
    keywordsDimensions
    keywordsStructural design
    keywordsStress analysis (Engineering)
    keywordsFracture (Materials)
    keywordsDesign AND Evaluation methods
    treeJournal of Electronic Packaging:;1992:;volume( 114 ):;issue: 004
    contenttypeFulltext
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