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    Asymptotic Expansions for the Thermal Stresses in Bonded Semi-Infinite Bimaterial Strips

    Source: Journal of Electronic Packaging:;1991:;volume( 113 ):;issue: 002::page 173
    Author:
    Mikyoung Lee
    ,
    I. Jasiuk
    DOI: 10.1115/1.2905383
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The plane elasticity problem of two semi-infinite bimaterial strips, that undergo constant temperature change, is considered. Following Bogy (1968), we use Airy stress function method, Mellin transform, and conformal mapping to investigate the asymptotic behavior of stresses at the interface near the edge of two strips.
    keyword(s): Thermal stresses , Strips , Stress , Elasticity AND Temperature ,
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      Asymptotic Expansions for the Thermal Stresses in Bonded Semi-Infinite Bimaterial Strips

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    http://yetl.yabesh.ir/yetl1/handle/yetl/108402
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    contributor authorMikyoung Lee
    contributor authorI. Jasiuk
    date accessioned2017-05-08T23:35:18Z
    date available2017-05-08T23:35:18Z
    date copyrightJune, 1991
    date issued1991
    identifier issn1528-9044
    identifier otherJEPAE4-26122#173_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/108402
    description abstractThe plane elasticity problem of two semi-infinite bimaterial strips, that undergo constant temperature change, is considered. Following Bogy (1968), we use Airy stress function method, Mellin transform, and conformal mapping to investigate the asymptotic behavior of stresses at the interface near the edge of two strips.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleAsymptotic Expansions for the Thermal Stresses in Bonded Semi-Infinite Bimaterial Strips
    typeJournal Paper
    journal volume113
    journal issue2
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2905383
    journal fristpage173
    journal lastpage177
    identifier eissn1043-7398
    keywordsThermal stresses
    keywordsStrips
    keywordsStress
    keywordsElasticity AND Temperature
    treeJournal of Electronic Packaging:;1991:;volume( 113 ):;issue: 002
    contenttypeFulltext
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