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contributor authorA. Zubelewicz
contributor authorR. Berriche
contributor authorL. M. Keer
contributor authorM. E. Fine
date accessioned2017-05-08T23:29:43Z
date available2017-05-08T23:29:43Z
date copyrightSeptember, 1989
date issued1989
identifier issn1528-9044
identifier otherJEPAE4-26110#179_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/105239
description abstractFatigue lifetimes of lead-low tin solders have been investigated. Results indicate that the Coffin-Manson law does not necessarily fit experimental data. The phenomenon can be correlated with a change in the failure mode as follows: transgranular and mixed for higher strain ranges, and intergranular at lower strains. The present modeling incorporates these micromechanical features, and in addition shows that the variation in the failure mode and in the magnitude of the stresses from varying strain range (during the cyclic process) coincide with each other.
publisherThe American Society of Mechanical Engineers (ASME)
titleLifetime Prediction of Solder Materials
typeJournal Paper
journal volume111
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.3226531
journal fristpage179
journal lastpage182
identifier eissn1043-7398
keywordsSolders
keywordsFailure
keywordsFatigue
keywordsStress AND Modeling
treeJournal of Electronic Packaging:;1989:;volume( 111 ):;issue: 003
contenttypeFulltext


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