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    Thermal and Mechanical Simulation and Experiments in Micro-electronics and Microsystems 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004:;page 465
    Author(s): L. J. Ernst; Guest Editor; G. Q. Zhang; Guest Editor
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This special issue includes selected papers presented at the International Conference of Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Paris, May ...
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    State-of-the-Art of Thermo-Mechanical Characterization of Thin Polymer Films 

    Source: Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 004:;page 530
    Author(s): K. M. Jansen; H. J. Bressers; G. Q. Zhang; V. Gonda; L. J. Ernst
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In microelectronic industry, thin polymer layers are one of the more commonly used product constituents. Examples are glue layers, coatings, and dielectric layers. The thicknesses of these films ...
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    Finite Thickness Influence on Spherical and Conical Indentation on Viscoelastic Thin Polymer Film 

    Source: Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 001:;page 33
    Author(s): V. Gonda; J. den Toonder; J. Beijer; L. J. Ernst; G. Q. Zhang
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The thermo-mechanical integration of polymer films requires a precise knowledge of material properties. Nanoindentation is a widely used testing method for the determination of material properties ...
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    A Micromechanics-Based Vapor Pressure Model in Electronic Packages 

    Source: Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 003:;page 262
    Author(s): X. J. Fan; J. Zhou; G. Q. Zhang; L. J. Ernst
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A complete vapor pressure model based on a micromechanics approach is developed in this paper. The model can be extended to calculate the initial vapor pressure as traction loading subjected ...
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    Response Surface Modeling for Nonlinear Packaging Stresses 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004:;page 490
    Author(s): W. D. van Driel; G. Q. Zhang; J. H. J. Janssen; L. J. Ernst
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The present study focuses on the development of reliable response surface models (RSM’s) for the major packaging processes of a typical electronic package. The major objective is to optimize ...
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    Time- and Temperature-Dependent Thermo-Mechanical Modeling of a Packaging Molding Compound and its Effect on Packaging Process Stresses 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004:;page 539
    Author(s): L. J. Ernst; G. Q. Zhang; K. M. B. Jansen; H. J. L. Bressers
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: For reliable virtual thermo-mechanical prototyping of electronic packages appropriate descriptions of the mechanical behavior of the constituent materials are essential. In many packages molding ...
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    Thermally Induced Delamination Buckling of a Thin Metal Layer on a Ceramic Substrate 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004:;page 512
    Author(s): C. J. Liu; G. Q. Zhang; M. Vervoort; L. J. Ernst; G. Wisse
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Interface delamination failure caused by thermomechanical loading and mismatch of thermal expansion coefficients and other material properties is one of the important failure modes occurring in ...
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    Solders Fatigue Prediction Using Interfacial Boundary Volume Criterion 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004:;page 582
    Author(s): X. J. Zhao; G. Q. Zhang; J. F. J. M. Caers; L. J. Ernst
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this paper, an “interfacial boundary volume” based damage criterion was proposed in combination with the modified Coffin-Manson model to predict solder fatigue. This criterion assumes that ...
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    Packaging Induced Die Stresses—Effect of Chip Anisotropy and Time-Dependent Behavior of a Molding Compound 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004:;page 520
    Author(s): W. D. van Driel; G. Q. Zhang; D. G. Yang; L. J. Ernst; J. H. J. Janssen
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper investigates the effect of the anisotropic behavior of the die and the time- and temperature-dependent behavior of epoxy molding compound on the packaging induced stresses for a quad ...
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    Mechanical Modeling and Characterization of the Curing Process of Underfill Materials 

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 002:;page 97
    Author(s): L. J. Ernst; G. Q. Zhang; H. J. L. Bressers; C. van ’t Hof; D. G. Yang; J. F. J. Caers; A. W. J. den Boer; M. S. Kiasat; J. Janssen
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thermo-setting polymers are widely used as underfill materials to improve the reliability of electronic packages. In the design phase, the influence of underfill applications on reliability is ...
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