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    Pull Force and Displacement of Cu/Au Wire Interconnects 

    Source: Journal of Electronic Packaging:;2012:;volume( 134 ):;issue: 004:;page 41002
    Author(s): J. Lau; S. Wu; J. M. Lau
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The pull force and displacement of gold (Au) and copper (Cu) wires in microelectronics are investigated in this study. Emphasis is placed on (1) the development of a set of equations for ...
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    Experimental and Analytical Studies of 28-Pin Thin Small Outline Package (TSOP) Solder-Joint Reliability 

    Source: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 002:;page 169
    Author(s): J. Lau; S. Golwalkar; S. Erasmus; R. Surratt; P. Boysan
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The reliability of 0.5 mm pitch, 28-Pin Thin Small Outline Package (TSOP) solder joints has been studied by experimental temperature cycling and a cost-effective 3-D nonlinear finite element ...
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    Fatigue Analysis of a Ceramic Pin Grid Array Soldered to an Orthotropic Epoxy Substrate 

    Source: Journal of Electronic Packaging:;1991:;volume( 113 ):;issue: 002:;page 138
    Author(s): J. Lau; R. Subrahmanyan; D. Rice; C. Li; S. Erasmus
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thermal stresses and strains in the solder joints and plated-through-hole (PTH) copper pads/barrels of a pin-grid array (PGA) assembly under thermal cycling conditions have been determined in the ...
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    Time Integration Algorithm for a Cyclic Damage Coupled Thermo-Viscoplasticity Model for 63Sn-37Pb Solder Applications 

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001:;page 148
    Author(s): Xianjie Yang; K. J. Lau; C. L. Chow
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this paper, a semi-implicit time integration scheme has been developed for a damage-coupled constitutive model to characterize the mechanical behavior of 63Sn-37Pb solder material under ...
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    Effect of Heat-Spreader Sizes on the Thermal Performance of Large Cavity-Down Plastic Ball Grid Array Packages 

    Source: Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 004:;page 242
    Author(s): J. Lau; T. Chen; S.-W. R. Lee
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The effect of heat-spreader sizes on the temperature distribution, thermal resistance, and cooling power of a set of cost-effective cavity-down plastic ball grid array (PBGA) packages assembled ...
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    Robust Fixture Configuration Design for Sheet Metal Assembly With Laser Welding 

    Source: Journal of Manufacturing Science and Engineering:;2003:;volume( 125 ):;issue: 001:;page 120
    Author(s): Bing Li; B. W. Shiu; K. J. Lau
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Fixturing plays an important role in the quality of metal fit-up for sheet metal assembly with laser welding. To reduce the sensitivity of the designed fixture configuration to location ...
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    Failure Analysis of No-Clean and Water-Clean Solder Joints 0.4 mm Pitch, 256-Pin Plastic Quad Flat Pack 

    Source: Journal of Electronic Packaging:;1994:;volume( 116 ):;issue: 003:;page 184
    Author(s): J. Lau; S. Twerefour; S. Erasmus; S. Dolot; R. K. Govila; Y.-H. Pao; C. Larner
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Printed circuit boards populated with twenty-five 0.4 mm pitch, 256-pin plastic quad flat packs (QFP) containing no-clean and water-clean solder joints were subjected to thermal cycling in order ...
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    Behavior of Lead-Free Solder Under Thermomechanical Loading 

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 003:;page 367
    Author(s): Y. Wei; K. J. Lau; P. Vianco; H. E. Fang; C. L. Chow
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper presents an investigation of lead-free Sn-Ag base alloy, 95.5Sn-3.9Ag-0.6Cu, both experimentally and analytically. Experimentally, the deformation behavior of the material was measured ...
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    Creep Analysis and Thermal-Fatigue Life Prediction of the Lead-Free Solder Sealing Ring of a Photonic Switch 

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 004:;page 403
    Author(s): J. Lau; Z. Mei; S. Pang; C. Amsden; J. Rayner; S. Pan
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thermal reliability of the solder sealing ring of Agilent Technologies’ bubble-actuated photonic cross-connect switches has been investigated in this paper. Emphasis is placed on the determination ...
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    Solder Joint Reliability of Surface Mount Connectors 

    Source: Journal of Electronic Packaging:;1993:;volume( 115 ):;issue: 002:;page 180
    Author(s): J. Lau; T. Marcotte; J. Severine; A. Lee; S. Erasmus; T. Baker; J. Moldaschel; M. Sporer; G. Burward-Hoy
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The solder joint reliability of five different surface mount connectors has been studied by eleven different experimental methods. A set of test methods and specifications for determining the ...
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