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contributor authorHo, Ching-Yuan
contributor authorLee, Haw-Teng
date accessioned2025-08-20T09:20:59Z
date available2025-08-20T09:20:59Z
date copyright5/12/2025 12:00:00 AM
date issued2025
identifier issn1043-7398
identifier otherep_147_03_031004.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4308130
description abstractThe microstructure transformation, mechanical properties, and fracture behavior of boron (B) decorated tin (Sn)-1.5%Ag-0.7%copper (Cu) (SAC157) solder joints with Cu pillars were analyzed. Three concentrations of B (0.015%, 0.020%, and 0.025%) were evenly mixed into the SAC157 solders. The addition of B refined the primary β-Sn phase and transformed the eutectic phase Ag3Sn from a plate-like structure to a dense stripe configuration. During high-temperature storage, coarse intermetallic compounds (IMCs) that extruded into the primary β-Sn in SAC157 solder were observed, and the growth of IMCs was inhibited by B-pinning boundary motion. Furthermore, the B additive simultaneously increased hardness and improved ductility by reducing grain size. In shear strength tests, the SAC157 solder exhibited a brittle fracture surface with a shorter displacement of 0.78 mm, compared to 1.2 mm of elongation in B-decorated SAC157 solders, which displayed ductile properties characterized by a dimpled fracture surface. In conclusion, B particles acted as heterogeneous nucleation sites, effectively refining the grain structure, inhibiting the growth of the eutectic phase, and simultaneously enhancing ductility without compromising hardness.
publisherThe American Society of Mechanical Engineers (ASME)
titleEvaluation of Phase Transformation on Boron Decorated Sn-1.5Ag-0.7 Cu Joined Cu Pillar for Packaging Connection
typeJournal Paper
journal volume147
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4068448
journal fristpage31004-1
journal lastpage31004-7
page7
treeJournal of Electronic Packaging:;2025:;volume( 147 ):;issue: 003
contenttypeFulltext


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