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contributor authorWeng, Andrew
contributor authorMovahedi, Hamidreza
contributor authorWong, Clement
contributor authorSiegel, Jason B.
contributor authorStefanopoulou, Anna
date accessioned2024-12-24T18:48:38Z
date available2024-12-24T18:48:38Z
date copyright1/8/2024 12:00:00 AM
date issued2024
identifier issn0022-0434
identifier otherds_146_01_011106.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4302784
description abstractThis paper proposes an analytical framework describing how initial capacity and resistance variability in parallel-connected battery cells may inflict additional variability or reduce variability while the cells age. We derive closed-form equations for current and SOC imbalance dynamics within a charge or discharge cycle. These dynamics are represented by a first-order equivalent circuit model and validated against experimental data. To demonstrate how current and state of charge (SOC) imbalance leads to cell degradation, we developed a successive update scheme in which the intercycle imbalance dynamics update the intracycle degradation dynamics, and vice versa. Using this framework, we demonstrate that current imbalance can cause convergent degradation trajectories, consistent with previous reports. However, we also demonstrate that different degradation assumptions, such as those associated with SOC imbalance, may cause divergent degradation. We finally highlight the role of different cell chemistries, including different OCV function nonlinearities, on system behavior, and derive analytical bounds on the SOC imbalance using Lyapunov analysis.
publisherThe American Society of Mechanical Engineers (ASME)
titleCurrent Imbalance in Dissimilar Parallel-Connected Batteries and the Fate of Degradation Convergence1
typeJournal Paper
journal volume146
journal issue1
journal titleJournal of Dynamic Systems, Measurement, and Control
identifier doi10.1115/1.4064028
journal fristpage11106-1
journal lastpage11106-17
page17
treeJournal of Dynamic Systems, Measurement, and Control:;2024:;volume( 146 ):;issue: 001
contenttypeFulltext


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