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    Analytical Modeling of Electronic and Photonic Materials Reliability: Perspective and Extension

    Source: Journal of Engineering Materials and Technology:;2023:;volume( 145 ):;issue: 003::page 31006-1
    Author:
    Suhir, E.
    DOI: 10.1115/1.4062085
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The objective of this review is twofold: to show materials scientists, mechanical engineers, and reliability physicists not involved in electronics, photonics, microelectronic-mechanical-systems (MEMS), or MOEMS (optical MEMS) engineering what kind of value they could bring to this important “high-tech” area, as well as to demonstrate to “high-tech” engineers how they could benefit from the application of what has been developed, for many years, in the general field of physical design for reliability of materials and structures employed in various fields of engineering and applied science and what could be effectively applied to their body of knowledge. Accordingly, in the perspective part of the review, some critical and even paradoxical, i.e., a priori nonobvious, problems encountered in microelectronics and photonics materials science, reliability physics, and structural analysis are addressed using what could be called analytical (“mathematical”) modeling. The extension part has to do with some specific, mostly aerospace, recent applications of the probabilistic design for reliability concept and analytical modeling effort.
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      Analytical Modeling of Electronic and Photonic Materials Reliability: Perspective and Extension

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    http://yetl.yabesh.ir/yetl1/handle/yetl/4294772
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    contributor authorSuhir, E.
    date accessioned2023-11-29T19:27:26Z
    date available2023-11-29T19:27:26Z
    date copyright3/28/2023 12:00:00 AM
    date issued3/28/2023 12:00:00 AM
    date issued2023-03-28
    identifier issn0094-4289
    identifier othermats_145_3_031006.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4294772
    description abstractThe objective of this review is twofold: to show materials scientists, mechanical engineers, and reliability physicists not involved in electronics, photonics, microelectronic-mechanical-systems (MEMS), or MOEMS (optical MEMS) engineering what kind of value they could bring to this important “high-tech” area, as well as to demonstrate to “high-tech” engineers how they could benefit from the application of what has been developed, for many years, in the general field of physical design for reliability of materials and structures employed in various fields of engineering and applied science and what could be effectively applied to their body of knowledge. Accordingly, in the perspective part of the review, some critical and even paradoxical, i.e., a priori nonobvious, problems encountered in microelectronics and photonics materials science, reliability physics, and structural analysis are addressed using what could be called analytical (“mathematical”) modeling. The extension part has to do with some specific, mostly aerospace, recent applications of the probabilistic design for reliability concept and analytical modeling effort.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleAnalytical Modeling of Electronic and Photonic Materials Reliability: Perspective and Extension
    typeJournal Paper
    journal volume145
    journal issue3
    journal titleJournal of Engineering Materials and Technology
    identifier doi10.1115/1.4062085
    journal fristpage31006-1
    journal lastpage31006-26
    page26
    treeJournal of Engineering Materials and Technology:;2023:;volume( 145 ):;issue: 003
    contenttypeFulltext
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