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contributor authorSuhir, E.
date accessioned2023-11-29T19:27:26Z
date available2023-11-29T19:27:26Z
date copyright3/28/2023 12:00:00 AM
date issued3/28/2023 12:00:00 AM
date issued2023-03-28
identifier issn0094-4289
identifier othermats_145_3_031006.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4294772
description abstractThe objective of this review is twofold: to show materials scientists, mechanical engineers, and reliability physicists not involved in electronics, photonics, microelectronic-mechanical-systems (MEMS), or MOEMS (optical MEMS) engineering what kind of value they could bring to this important “high-tech” area, as well as to demonstrate to “high-tech” engineers how they could benefit from the application of what has been developed, for many years, in the general field of physical design for reliability of materials and structures employed in various fields of engineering and applied science and what could be effectively applied to their body of knowledge. Accordingly, in the perspective part of the review, some critical and even paradoxical, i.e., a priori nonobvious, problems encountered in microelectronics and photonics materials science, reliability physics, and structural analysis are addressed using what could be called analytical (“mathematical”) modeling. The extension part has to do with some specific, mostly aerospace, recent applications of the probabilistic design for reliability concept and analytical modeling effort.
publisherThe American Society of Mechanical Engineers (ASME)
titleAnalytical Modeling of Electronic and Photonic Materials Reliability: Perspective and Extension
typeJournal Paper
journal volume145
journal issue3
journal titleJournal of Engineering Materials and Technology
identifier doi10.1115/1.4062085
journal fristpage31006-1
journal lastpage31006-26
page26
treeJournal of Engineering Materials and Technology:;2023:;volume( 145 ):;issue: 003
contenttypeFulltext


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