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contributor authorChen, Erteng
contributor authorDai, Zhaohe
date accessioned2023-11-29T18:50:23Z
date available2023-11-29T18:50:23Z
date copyright7/18/2023 12:00:00 AM
date issued7/18/2023 12:00:00 AM
date issued2023-07-18
identifier issn0021-8936
identifier otherjam_90_10_101011.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4294407
description abstractWe study the mechanical behavior of a thin elastic film that is affixed to a rigid substrate and subjected to a transverse force using a shaft with a finite radius. This scenario, also referred to as axisymmetric peeling, is encountered frequently in conventional blister tests as well as in our daily lives when removing an adhesive film from a substrate. Our primary objective is to gain a quantitative understanding of how the shaft’s radius influences the relationships between force and displacement, as well as between force and delamination areas. These relationships can serve as a dependable method to determine both the film’s elastic modulus and the adhesion strength between the film and its substrate. In this work, we provide a simple perturbation solution to this geometrically nonlinear problem while avoiding any use of ad hoc assumptions that were previously required. As a result, our results are in excellent agreement with numerical simulations and offer improved accuracy compared to analytical solutions available in the literature.
publisherThe American Society of Mechanical Engineers (ASME)
titleAxisymmetric Peeling of Thin Elastic Films: A Perturbation Solution
typeJournal Paper
journal volume90
journal issue10
journal titleJournal of Applied Mechanics
identifier doi10.1115/1.4062831
journal fristpage101011-1
journal lastpage101011-9
page9
treeJournal of Applied Mechanics:;2023:;volume( 090 ):;issue: 010
contenttypeFulltext


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