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contributor authorJia, Hongfeng
contributor authorYu, Huabin
contributor authorRen, Zhongjie
contributor authorXing, Chong
contributor authorLiu, Zhongling
contributor authorKang, Yang
contributor authorSun, Haiding
date accessioned2022-02-04T21:56:34Z
date available2022-02-04T21:56:34Z
date copyright6/8/2020 12:00:00 AM
date issued2020
identifier issn1043-7398
identifier otherep_142_03_031115.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4274571
description abstractAn aluminum-rich AlGaN layer is commonly implemented to act as an electron-blocking layer (EBL) to block electron overflow from the active region in the conventional deep-ultraviolet light-emitting diodes (DUV LEDs). Herein, we propose a DUV LED device architecture with specially designed band-engineered quantum barriers (QBs) to “serve” as an alternative approach to alleviate such overflow effect, suppressing the electron leakage, and facilitating the electron and hole injection into the active region for efficient radiative recombination. Intriguingly, a much smaller efficiency droop with a significant enhancement of light output power (LOP) by nearly 50% can be achieved at the injection current level of 120 mA in such EBL-free device, in comparison with the conventional EBL-incorporated DUV LED structure. Thus, the EBL-free device architecture provides us an alternative path toward the realization of efficient DUV light emitters.
publisherThe American Society of Mechanical Engineers (ASME)
titleNearly Efficiency-Droop-Free AlGaN-Based Deep-Ultraviolet Light-Emitting Diode Without Electron-Blocking Layer
typeJournal Paper
journal volume142
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4047286
journal fristpage031115-1
journal lastpage031115-6
page6
treeJournal of Electronic Packaging:;2020:;volume( 142 ):;issue: 003
contenttypeFulltext


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