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contributor authorSu, Sinan
contributor authorAkkara, Francy John
contributor authorThaper, Ravinder
contributor authorAlkhazali, Atif
contributor authorHamasha, Mohammad
contributor authorHamasha, Sa'd
date accessioned2019-09-18T09:07:36Z
date available2019-09-18T09:07:36Z
date copyright5/17/2019 12:00:00 AM
date issued2019
identifier issn1043-7398
identifier otherep_141_04_040802
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4259168
description abstractFatigue failure of solder joints is one of the major causes of failure in electronic devices. Fatigue life prediction models of solder joints were first put forward in the early 1960s, and since then, numbers of methods were used to model the fatigue mechanism of solder joints. In this article, the majority fatigue life models are summarized, with emphasis on the latest developments in the fatigue life prediction methods. All the models reviewed are grouped into four categories based on the factors affecting the fatigue life of solder joints, which are: plastic strain-based fatigue models, creep damage-based fatigue models, energy-based fatigue models, and damage accumulation-based fatigue models. The models that do not fit any of the above categories are grouped into “other models.” Applications and potential limitations for those models are also discussed.
publisherAmerican Society of Mechanical Engineers (ASME)
titleA State-of-the-Art Review of Fatigue Life Prediction Models for Solder Joint
typeJournal Paper
journal volume141
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4043405
journal fristpage40802
journal lastpage040802-13
treeJournal of Electronic Packaging:;2019:;volume( 141 ):;issue: 004
contenttypeFulltext


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