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contributor authorLu, Mei-Chien
date accessioned2019-06-08T09:30:01Z
date available2019-06-08T09:30:01Z
date copyright4/10/2019 12:00:00 AM
date issued2019
identifier issn1043-7398
identifier otherep_141_03_031002.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4257837
description abstractThermal interface materials (TIMs) are crucial elements for packaging of power electronics. In particular, development of high-temperature lead-free die-attach TIMs for silicon carbide wide bandgap power electronics is a challenge. Among major options, sintered silver shows advantages in ease of applications. Cost, performance, reliability, and integration are concerns for technology implementation. The current study first discusses issues and status reported in literatures. Then it focuses on cost reduction and performance improvement of sintered silver using enhancement structures at micro- and nano-scales. A few design architectures are analyzed by finite element methods. The feasibility of strengthening edges and corners is also assessed. The downside of potential increase of unfavorable stresses to accelerate void coalescence would be optimized in conjunction with design concept of power electronics package modules for paths of solutions in the form of integrated systems. Demands of developing new high-temperature packaging materials to enable optimized package designs are also highlighted.
publisherThe American Society of Mechanical Engineers (ASME)
titleEnhanced Sintered Silver for SiC Wide Bandgap Power Electronics Integrated Package Module
typeJournal Paper
journal volume141
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4042984
journal fristpage31002
journal lastpage031002-13
treeJournal of Electronic Packaging:;2019:;volume( 141 ):;issue: 003
contenttypeFulltext


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