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contributor authorMahan, Kenny
contributor authorRosen, David
contributor authorHan, Bongtae
date accessioned2017-11-25T07:21:00Z
date available2017-11-25T07:21:00Z
date copyright2016/09/02
date issued2016
identifier issn1043-7398
identifier otherep_138_04_041003.pdf
identifier urihttp://138.201.223.254:8080/yetl1/handle/yetl/4236822
description abstractA blister testing procedure combined with a numerical procedure can be used effectively for characterizing the adhesion strength. A challenge arises when it is implemented after subjecting samples to various environmental conditions. The concept of pseudoproperty is introduced to cope with the problem associated with property changes during environmental testing. The pseudoproperty set is determined directly from a deflection versus pressure curve obtained from a typical blister test. A classical energy balance approach is followed to evaluate the energy release rate from the critical pressure and pseudoproperty set. The proposed approach is carried out for an epoxy/copper interface after subjecting samples to full moisture saturation and a high temperature storage condition. In spite of significant change in property, the energy release rates are calculated accurately without extra tests for property measurements.
publisherThe American Society of Mechanical Engineers (ASME)
titleBlister Testing for Adhesion Strength Measurement of Polymer Films Subjected to Environmental Conditions
typeJournal Paper
journal volume138
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4034454
journal fristpage41003
journal lastpage041003-8
treeJournal of Electronic Packaging:;2016:;volume( 138 ):;issue: 004
contenttypeFulltext


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