YaBeSH Engineering and Technology Library

    • Journals
    • PaperQuest
    • YSE Standards
    • YaBeSH
    • Login
    View Item 
    •   YE&T Library
    • ASME
    • Journal of Applied Mechanics
    • View Item
    •   YE&T Library
    • ASME
    • Journal of Applied Mechanics
    • View Item
    • All Fields
    • Source Title
    • Year
    • Publisher
    • Title
    • Subject
    • Author
    • DOI
    • ISBN
    Advanced Search
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Archive

    The Temperature Dependent Viscoelastic Behavior of Dielectric Elastomers

    Source: Journal of Applied Mechanics:;2015:;volume( 082 ):;issue: 009::page 91009
    Author:
    Guo, Jingkai
    ,
    Xiao, Rui
    ,
    Park, Harold S.
    ,
    Nguyen, Thao D.
    DOI: 10.1115/1.4030850
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this paper, we investigated the temperaturedependent viscoelastic behavior of dielectric elastomers (DEs) and the effects of viscoelasticity on the electroactuation behavior. We performed dynamic thermomechanical analysis to measure the master curve of the stress relaxation function and the temperature dependence of the relaxation time of VHB 4905, a commonly used DE. The master curve was applied to calculate the viscoelastic spectrum for a discrete multiprocess finite deformation viscoelastic model. In addition, we performed uniaxial creep and stress relaxation experiments and electrical actuation experiments under different prestretch conditions. The measured spectrum was applied to predict the experimental results. Generally, the model produced good quantitative agreement with both the viscoelastic and electroactuation experiments, which shows the necessity of using a multiprocess relaxation model to accurately capture the viscoelastic response for VHB. However, the model underpredicted the electroactuated creep strain for high voltages near the pullin instability. We attributed the discrepancies to the complex boundary conditions that were not taken into account in the simulation. We also investigated the failure of VHB membrane caused by viscoelastic creep when prestretched and subjected to constant voltage loading. The experimental time to failure for the specimens decreased exponentially with voltage, which agreed well with the predictions of the model.
    • Download: (1.069Mb)
    • Show Full MetaData Hide Full MetaData
    • Get RIS
    • Item Order
    • Go To Publisher
    • Price: 5000 Rial
    • Statistics

      The Temperature Dependent Viscoelastic Behavior of Dielectric Elastomers

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/156995
    Collections
    • Journal of Applied Mechanics

    Show full item record

    contributor authorGuo, Jingkai
    contributor authorXiao, Rui
    contributor authorPark, Harold S.
    contributor authorNguyen, Thao D.
    date accessioned2017-05-09T01:14:49Z
    date available2017-05-09T01:14:49Z
    date issued2015
    identifier issn0021-8936
    identifier otherjam_082_09_091009.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/156995
    description abstractIn this paper, we investigated the temperaturedependent viscoelastic behavior of dielectric elastomers (DEs) and the effects of viscoelasticity on the electroactuation behavior. We performed dynamic thermomechanical analysis to measure the master curve of the stress relaxation function and the temperature dependence of the relaxation time of VHB 4905, a commonly used DE. The master curve was applied to calculate the viscoelastic spectrum for a discrete multiprocess finite deformation viscoelastic model. In addition, we performed uniaxial creep and stress relaxation experiments and electrical actuation experiments under different prestretch conditions. The measured spectrum was applied to predict the experimental results. Generally, the model produced good quantitative agreement with both the viscoelastic and electroactuation experiments, which shows the necessity of using a multiprocess relaxation model to accurately capture the viscoelastic response for VHB. However, the model underpredicted the electroactuated creep strain for high voltages near the pullin instability. We attributed the discrepancies to the complex boundary conditions that were not taken into account in the simulation. We also investigated the failure of VHB membrane caused by viscoelastic creep when prestretched and subjected to constant voltage loading. The experimental time to failure for the specimens decreased exponentially with voltage, which agreed well with the predictions of the model.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleThe Temperature Dependent Viscoelastic Behavior of Dielectric Elastomers
    typeJournal Paper
    journal volume82
    journal issue9
    journal titleJournal of Applied Mechanics
    identifier doi10.1115/1.4030850
    journal fristpage91009
    journal lastpage91009
    identifier eissn1528-9036
    treeJournal of Applied Mechanics:;2015:;volume( 082 ):;issue: 009
    contenttypeFulltext
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian
     
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian