Electrostatically Driven Creep in Viscoelastic Dielectric Elastomers

Abstract

We utilize a nonlinear, dynamic finite element model coupled with a finite deformation viscoelastic constitutive law to study the inhomogeneous deformation and instabilities resulting from the application of a constant voltage to dielectric elastomers. The constant voltage loading is used to study electrostatically driven creep and the resulting electromechanical instabilities for two different cases that have all been experimentally observed, i.e., electromechanical snapthrough instability and bursting drops in a dielectric elastomer. We find that in general, increasing the viscoelastic relaxation time leads to an increase in time needed to nucleate the electromechanical instability. However, we find for these two cases that the time needed to nucleate the instability scales with the relaxation time.