| contributor author | Cheng, Huanyu | |
| contributor author | Wang, Shuodao | |
| date accessioned | 2017-05-09T01:04:48Z | |
| date available | 2017-05-09T01:04:48Z | |
| date issued | 2014 | |
| identifier issn | 0021-8936 | |
| identifier other | jam_081_04_044501.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/153804 | |
| description abstract | In order to provide continuous diagnostic and therapeutic options that exploit electrophysiological signals from the epidermis, this study discusses epidermal electronics systems (EES) that conform to the skin surface via van der Waals force alone, which is otherwise susceptible to artifacts associated with motioninduced changes. This paper not only establishes a criterion of conformal contact between the EES and the skin for both initial contact and the case where the skin is subject to external loading but also investigates the criterion to prevent any partial delamination between electronics and the skin. These results improve the performance of EES by maximizing intimate contact between the EES and skin, revealing important underlying physical insights for device optimization and future design. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Mechanics of Interfacial Delamination in Epidermal Electronics Systems | |
| type | Journal Paper | |
| journal volume | 81 | |
| journal issue | 4 | |
| journal title | Journal of Applied Mechanics | |
| identifier doi | 10.1115/1.4025305 | |
| journal fristpage | 44501 | |
| journal lastpage | 44501 | |
| identifier eissn | 1528-9036 | |
| tree | Journal of Applied Mechanics:;2014:;volume( 081 ):;issue: 004 | |
| contenttype | Fulltext | |