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contributor authorTao, Bo
contributor authorWu, Guanghua
contributor authorYin, Zhouping
contributor authorXiong, Youlun
date accessioned2017-05-09T00:57:46Z
date available2017-05-09T00:57:46Z
date issued2013
identifier issn1528-9044
identifier otherep_135_04_041008.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/151448
description abstractHygrothermal environments can degrade anisotropic conductive adhesive (ACA) joints by weakening the shear strength of adhesive interface. In this paper, the shear strength degradation model of ACA joints under hygrothermal conditions was formulated through experimental testing and theoretical modeling. The shear strength degradation data were obtained from different hygrothermal aging tests and the ACA moisture properties were characterized for the corresponding hygrothermal conditions. Theoretical models considering the hygrothermal factors of T (temperature), RH (relative humidity), and t (time), were used to fit the shear strength degradation data. It was found that the inverse exponential law was the best candidate model to predict the degradation data. The shear strength degradation model of ACA joints under hygrothermal conditions was proposed, where the relationship of the S (shear strength) and the hygrothermal factors (T, RH, and t) was expressed in an analytical model. The degradation model was validated by experiments, and the model predictions agreed well with the test results.
publisherThe American Society of Mechanical Engineers (ASME)
titleA Shear Strength Degradation Model for Anisotropic Conductive Adhesive Joints Under Hygrothermal Conditions
typeJournal Paper
journal volume135
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4025840
journal fristpage41008
journal lastpage41008
identifier eissn1043-7398
treeJournal of Electronic Packaging:;2013:;volume( 135 ):;issue: 004
contenttypeFulltext


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