Show simple item record

contributor authorDa Yu
contributor authorJae Kwak
contributor authorSeungbae Park
contributor authorSoonwan Chung
contributor authorJi-Young Yoon
date accessioned2017-05-09T00:49:26Z
date available2017-05-09T00:49:26Z
date copyrightSeptember, 2012
date issued2012
identifier issn1528-9044
identifier otherJEPAE4-926029#031010_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/148581
description abstractIn order to protect the electronic components of electronic devices on a printed circuit board (PCB) against electromagnetic radiation, a conductive shield-can or box is normally attached to the PCB covering the electronic components. In particular, handheld electronic devices are prone to be subjected to drop impact. This means that the products would experience a significant amount of out-of-plane deformation along the PCB, which may cause stresses eventually resulting in solder joint failures. The attached shield-can could provide additional mechanical strength and minimize the out-of-plane deformation, especially where the electronic package is located. In this study, both the dynamic responses of the PCB and the characteristic life of solder joints with different shield-can designs were investigated, which are seldom explored by other researchers. In the board-level drop tests, a noncontact full-field optical measurement technique, digital image correlation (DIC) with images taken by stereo-high-speed cameras, was used to obtain full-field displacement data showing the dynamic responses of the PCB during the drop impact. PCBs with a fine ball grid array (FBGA) package were prepared with various types of shield-can attached. From the experimental results the effects of different shield-can types, varying in shape and size on the dynamic responses of the PCB, were analyzed. In addition, the number of drops to failure for each shield-can was also recorded by an event detector. Using ANSYS/LS-DYNA, an accurately validated finite element model has been developed. Then the stress analysis could be performed in order to study the failure mechanism by finding the maximum tensile stress of the solder joints during the drop impact and correlate the stress results with the characteristic life of solder joint.
publisherThe American Society of Mechanical Engineers (ASME)
titleEffect of Shield-Can on Dynamic Response of Board-Level Assembly
typeJournal Paper
journal volume134
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4007118
journal fristpage31010
identifier eissn1043-7398
keywordsStress
keywordsDrops
keywordsDeformation
keywordsDynamic response
keywordsFailure
keywordsShapes
keywordsSolder joints
keywordsDisplacement
keywordsManufacturing
keywordsFinite element model
keywordsStress analysis (Engineering) AND Failure mechanisms
treeJournal of Electronic Packaging:;2012:;volume( 134 ):;issue: 003
contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record