YaBeSH Engineering and Technology Library

    • Journals
    • PaperQuest
    • YSE Standards
    • YaBeSH
    • Login
    View Item 
    •   YE&T Library
    • ASME
    • Journal of Engineering Materials and Technology
    • View Item
    •   YE&T Library
    • ASME
    • Journal of Engineering Materials and Technology
    • View Item
    • All Fields
    • Source Title
    • Year
    • Publisher
    • Title
    • Subject
    • Author
    • DOI
    • ISBN
    Advanced Search
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Archive

    Theoretical and Experimental Characterization for the Inelastic Behavior of the Micro-/Nanostructured Thin Films Using Strain Gradient Plasticity With Interface Energy

    Source: Journal of Engineering Materials and Technology:;2009:;volume( 131 ):;issue: 004::page 41202
    Author:
    George Z. Voyiadjis
    ,
    Babur Deliktas
    DOI: 10.1115/1.3183774
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thin film technology is pervasive in many applications, including microelectronics, optics, magnetic, hard and corrosion resistant coatings, micromechanics, etc. Therefore, basic research activities will be necessary in the future to increase knowledge and understanding and to develop predictive capabilities for relating fundamental physical and chemical properties to the microstructure and performance of thin films in various applications. In basic research, special model systems are needed for quantitative investigation of the relevant and fundamental processes in thin film material science. Because of the diversity of the subject and the sheer volume of the publications, a complete a review of the area of the current study is focused particularly on the experimental and theoretical investigations for the inelastic behavior of the micro-/nanostructured thin films.
    keyword(s): Thin films , Plasticity , Deformation , Stress , Boundary-value problems , Dislocations , Gradients , Modeling AND Shear (Mechanics) ,
    • Download: (512.8Kb)
    • Show Full MetaData Hide Full MetaData
    • Get RIS
    • Item Order
    • Go To Publisher
    • Price: 5000 Rial
    • Statistics

      Theoretical and Experimental Characterization for the Inelastic Behavior of the Micro-/Nanostructured Thin Films Using Strain Gradient Plasticity With Interface Energy

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/140566
    Collections
    • Journal of Engineering Materials and Technology

    Show full item record

    contributor authorGeorge Z. Voyiadjis
    contributor authorBabur Deliktas
    date accessioned2017-05-09T00:32:51Z
    date available2017-05-09T00:32:51Z
    date copyrightOctober, 2009
    date issued2009
    identifier issn0094-4289
    identifier otherJEMTA8-27122#041202_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/140566
    description abstractThin film technology is pervasive in many applications, including microelectronics, optics, magnetic, hard and corrosion resistant coatings, micromechanics, etc. Therefore, basic research activities will be necessary in the future to increase knowledge and understanding and to develop predictive capabilities for relating fundamental physical and chemical properties to the microstructure and performance of thin films in various applications. In basic research, special model systems are needed for quantitative investigation of the relevant and fundamental processes in thin film material science. Because of the diversity of the subject and the sheer volume of the publications, a complete a review of the area of the current study is focused particularly on the experimental and theoretical investigations for the inelastic behavior of the micro-/nanostructured thin films.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleTheoretical and Experimental Characterization for the Inelastic Behavior of the Micro-/Nanostructured Thin Films Using Strain Gradient Plasticity With Interface Energy
    typeJournal Paper
    journal volume131
    journal issue4
    journal titleJournal of Engineering Materials and Technology
    identifier doi10.1115/1.3183774
    journal fristpage41202
    identifier eissn1528-8889
    keywordsThin films
    keywordsPlasticity
    keywordsDeformation
    keywordsStress
    keywordsBoundary-value problems
    keywordsDislocations
    keywordsGradients
    keywordsModeling AND Shear (Mechanics)
    treeJournal of Engineering Materials and Technology:;2009:;volume( 131 ):;issue: 004
    contenttypeFulltext
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian
     
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian