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contributor authorGeorge Z. Voyiadjis
contributor authorBabur Deliktas
date accessioned2017-05-09T00:32:51Z
date available2017-05-09T00:32:51Z
date copyrightOctober, 2009
date issued2009
identifier issn0094-4289
identifier otherJEMTA8-27122#041202_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/140566
description abstractThin film technology is pervasive in many applications, including microelectronics, optics, magnetic, hard and corrosion resistant coatings, micromechanics, etc. Therefore, basic research activities will be necessary in the future to increase knowledge and understanding and to develop predictive capabilities for relating fundamental physical and chemical properties to the microstructure and performance of thin films in various applications. In basic research, special model systems are needed for quantitative investigation of the relevant and fundamental processes in thin film material science. Because of the diversity of the subject and the sheer volume of the publications, a complete a review of the area of the current study is focused particularly on the experimental and theoretical investigations for the inelastic behavior of the micro-/nanostructured thin films.
publisherThe American Society of Mechanical Engineers (ASME)
titleTheoretical and Experimental Characterization for the Inelastic Behavior of the Micro-/Nanostructured Thin Films Using Strain Gradient Plasticity With Interface Energy
typeJournal Paper
journal volume131
journal issue4
journal titleJournal of Engineering Materials and Technology
identifier doi10.1115/1.3183774
journal fristpage41202
identifier eissn1528-8889
keywordsThin films
keywordsPlasticity
keywordsDeformation
keywordsStress
keywordsBoundary-value problems
keywordsDislocations
keywordsGradients
keywordsModeling AND Shear (Mechanics)
treeJournal of Engineering Materials and Technology:;2009:;volume( 131 ):;issue: 004
contenttypeFulltext


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