YaBeSH Engineering and Technology Library

    • Journals
    • PaperQuest
    • YSE Standards
    • YaBeSH
    • Login
    View Item 
    •   YE&T Library
    • ASME
    • Journal of Engineering Materials and Technology
    • View Item
    •   YE&T Library
    • ASME
    • Journal of Engineering Materials and Technology
    • View Item
    • All Fields
    • Source Title
    • Year
    • Publisher
    • Title
    • Subject
    • Author
    • DOI
    • ISBN
    Advanced Search
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Archive

    Closure to “Discussion: ‘On the Reference Length and Mode Mixity for a Bimaterial Interface’ ” (2008, ASME J. Eng. Mater. Technol., 130, p. 045501)

    Source: Journal of Engineering Materials and Technology:;2008:;volume( 130 ):;issue: 004::page 45502
    Author:
    A. M. Karlsson
    DOI: 10.1115/1.2975232
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The method proposed by Agrawal and Karlsson (1) is correct when assuming a symmetric interfacial fracture toughness curve. Based on the resolution (e.g., the scatter in the data) from the experimental results, an antisymmetric interfacial fracture toughness curve cannot be assumed, as suggested by Mantic (2). However, if one anticipates an antisymmetric curve, the methodology outline in the first comment by Mantic (2) may be appropriate. Additional experiments are needed to achieve such results, so the characteristics of the minimum of the curve can be established.
    keyword(s): Resolution (Optics) , Electromagnetic scattering , Testing AND Fracture toughness ,
    • Download: (29.52Kb)
    • Show Full MetaData Hide Full MetaData
    • Get RIS
    • Item Order
    • Go To Publisher
    • Price: 5000 Rial
    • Statistics

      Closure to “Discussion: ‘On the Reference Length and Mode Mixity for a Bimaterial Interface’ ” (2008, ASME J. Eng. Mater. Technol., 130, p. 045501)

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/138047
    Collections
    • Journal of Engineering Materials and Technology

    Show full item record

    contributor authorA. M. Karlsson
    date accessioned2017-05-09T00:28:09Z
    date available2017-05-09T00:28:09Z
    date copyrightOctober, 2008
    date issued2008
    identifier issn0094-4289
    identifier otherJEMTA8-27111#045502_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/138047
    description abstractThe method proposed by Agrawal and Karlsson (1) is correct when assuming a symmetric interfacial fracture toughness curve. Based on the resolution (e.g., the scatter in the data) from the experimental results, an antisymmetric interfacial fracture toughness curve cannot be assumed, as suggested by Mantic (2). However, if one anticipates an antisymmetric curve, the methodology outline in the first comment by Mantic (2) may be appropriate. Additional experiments are needed to achieve such results, so the characteristics of the minimum of the curve can be established.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleClosure to “Discussion: ‘On the Reference Length and Mode Mixity for a Bimaterial Interface’ ” (2008, ASME J. Eng. Mater. Technol., 130, p. 045501)
    typeJournal Paper
    journal volume130
    journal issue4
    journal titleJournal of Engineering Materials and Technology
    identifier doi10.1115/1.2975232
    journal fristpage45502
    identifier eissn1528-8889
    keywordsResolution (Optics)
    keywordsElectromagnetic scattering
    keywordsTesting AND Fracture toughness
    treeJournal of Engineering Materials and Technology:;2008:;volume( 130 ):;issue: 004
    contenttypeFulltext
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian
     
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian