| contributor author | A. M. Karlsson | |
| date accessioned | 2017-05-09T00:28:09Z | |
| date available | 2017-05-09T00:28:09Z | |
| date copyright | October, 2008 | |
| date issued | 2008 | |
| identifier issn | 0094-4289 | |
| identifier other | JEMTA8-27111#045502_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/138047 | |
| description abstract | The method proposed by Agrawal and Karlsson (1) is correct when assuming a symmetric interfacial fracture toughness curve. Based on the resolution (e.g., the scatter in the data) from the experimental results, an antisymmetric interfacial fracture toughness curve cannot be assumed, as suggested by Mantic (2). However, if one anticipates an antisymmetric curve, the methodology outline in the first comment by Mantic (2) may be appropriate. Additional experiments are needed to achieve such results, so the characteristics of the minimum of the curve can be established. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Closure to “Discussion: ‘On the Reference Length and Mode Mixity for a Bimaterial Interface’ ” (2008, ASME J. Eng. Mater. Technol., 130, p. 045501) | |
| type | Journal Paper | |
| journal volume | 130 | |
| journal issue | 4 | |
| journal title | Journal of Engineering Materials and Technology | |
| identifier doi | 10.1115/1.2975232 | |
| journal fristpage | 45502 | |
| identifier eissn | 1528-8889 | |
| keywords | Resolution (Optics) | |
| keywords | Electromagnetic scattering | |
| keywords | Testing AND Fracture toughness | |
| tree | Journal of Engineering Materials and Technology:;2008:;volume( 130 ):;issue: 004 | |
| contenttype | Fulltext | |