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contributor authorA. M. Karlsson
date accessioned2017-05-09T00:28:09Z
date available2017-05-09T00:28:09Z
date copyrightOctober, 2008
date issued2008
identifier issn0094-4289
identifier otherJEMTA8-27111#045502_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/138047
description abstractThe method proposed by Agrawal and Karlsson (1) is correct when assuming a symmetric interfacial fracture toughness curve. Based on the resolution (e.g., the scatter in the data) from the experimental results, an antisymmetric interfacial fracture toughness curve cannot be assumed, as suggested by Mantic (2). However, if one anticipates an antisymmetric curve, the methodology outline in the first comment by Mantic (2) may be appropriate. Additional experiments are needed to achieve such results, so the characteristics of the minimum of the curve can be established.
publisherThe American Society of Mechanical Engineers (ASME)
titleClosure to “Discussion: ‘On the Reference Length and Mode Mixity for a Bimaterial Interface’ ” (2008, ASME J. Eng. Mater. Technol., 130, p. 045501)
typeJournal Paper
journal volume130
journal issue4
journal titleJournal of Engineering Materials and Technology
identifier doi10.1115/1.2975232
journal fristpage45502
identifier eissn1528-8889
keywordsResolution (Optics)
keywordsElectromagnetic scattering
keywordsTesting AND Fracture toughness
treeJournal of Engineering Materials and Technology:;2008:;volume( 130 ):;issue: 004
contenttypeFulltext


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