Show simple item record

contributor authorD. Bhate
contributor authorL. Nguyen
contributor authorD. Chan
contributor authorG. Subbarayan
date accessioned2017-05-09T00:27:35Z
date available2017-05-09T00:27:35Z
date copyrightJune, 2008
date issued2008
identifier issn1528-9044
identifier otherJEPAE4-26285#021003_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/137766
description abstractPredicting the fatigue life of solder interconnections is a challenge due to the complex nonlinear behavior of solder alloys and the importance of the load history. Long experience with Sn–Pb solder alloys together with empirical fatigue life models such as the Coffin–Manson rule have helped us identify reliable choices among package design alternatives. However, for the currently popular Pb-free choice of SnAgCu solder joints, designing accelerated thermal cycling tests and estimating the fatigue life are challenged by the significantly different creep behavior relative to Sn–Pb alloys. In this paper, a hybrid fatigue modeling approach inspired by nonlinear fracture mechanics is developed to predict the crack trajectory and fatigue life of a solder interconnection. The model is shown to be similar to well accepted cohesive zone models in its theoretical development and application and is anticipated to be computationally more efficient compared to cohesive zone models in a finite element setting. The approach goes beyond empirical modeling in accurately predicting crack trajectories and is validated against experiments performed on lead-free as well as Sn–Pb solder joint containing microelectronic packages. Material parameters relevant to the model are estimated via a coupled experimental and numerical technique.
publisherThe American Society of Mechanical Engineers (ASME)
titleA Nonlinear Fracture Mechanics Approach to Modeling Fatigue Crack Growth in Solder Joints
typeJournal Paper
journal volume130
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2840057
journal fristpage21003
identifier eissn1043-7398
keywordsFracture (Materials)
keywordsModeling
keywordsFatigue cracks
keywordsSolder joints
keywordsFracture mechanics
keywordsFatigue AND Solders
treeJournal of Electronic Packaging:;2008:;volume( 130 ):;issue: 002
contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record