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contributor authorHironori Tohmyoh
contributor authorJiro Utsunomiya
contributor authorYoshikatsu Nakano
contributor authorTakeshi Nakamura
contributor authorKiichiro Yamanobe
contributor authorMasumi Saka
date accessioned2017-05-09T00:27:34Z
date available2017-05-09T00:27:34Z
date copyrightSeptember, 2008
date issued2008
identifier issn1528-9044
identifier otherJEPAE4-26287#031007_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/137755
description abstractThis paper deals with typical mechanical problems that are encountered in a solderless press-fit assembly process. First, the elastic-plastic properties of two types of press-fit pins and the friction coefficients of the pins in thin plated through holes are determined both experimentally and by three-dimensional finite element analysis. The elastic-plastic properties of the press-fit pins are determined by small-scale testing under three-point bending. The coefficients of friction of the pins in the through holes are successfully determined from the load-displacement relationships of the pins during press-fit assembly processes. The validity of the parameters that are determined is clarified by inserting the press-fit pins into holes of different diameters. By comparing the damaged areas of the printed circuit boards after assembly and the numerically obtained stress distributions, the failure stress of the boards is determined. Finally, both the retention force of the pins and the degree of damage to the printed circuit boards after assembly are predicted by numerical analysis.
publisherThe American Society of Mechanical Engineers (ASME)
titleAnalysis of Solderless Press-Fit Interconnections During the Assembly Process
typeJournal Paper
journal volume130
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2957330
journal fristpage31007
identifier eissn1043-7398
keywordsManufacturing
keywordsPins (Engineering)
keywordsPresses
keywordsFinite element analysis
keywordsStress AND Friction
treeJournal of Electronic Packaging:;2008:;volume( 130 ):;issue: 003
contenttypeFulltext


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