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contributor authorChang-Lin Yeh
contributor authorYi-Shao Lai
date accessioned2017-05-09T00:23:28Z
date available2017-05-09T00:23:28Z
date copyrightMarch, 2007
date issued2007
identifier issn1528-9044
identifier otherJEPAE4-26272#98_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/135593
description abstractThe ball impact test is developed as a package-level measure of the board-level reliability of solder joints in the sense that it leads to brittle intermetallic fracturing, similar to that from a board-level drop test. Following classical structural dynamics principles, the ball impact test process is analyzed to provide insights into transient characteristics of this particular test methodology. A design guideline for the ball impact test apparatus based on characteristics of the measured impact force profile is proposed.
publisherThe American Society of Mechanical Engineers (ASME)
titleDesign Guideline for Ball Impact Test Apparatus
typeJournal Paper
journal volume129
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2429716
journal fristpage98
journal lastpage104
identifier eissn1043-7398
keywordsForce
keywordsDesign
keywordsSolder joints
keywordsImpact testing
keywordsFracture (Process)
keywordsDamping
keywordsBrittleness AND Drops
treeJournal of Electronic Packaging:;2007:;volume( 129 ):;issue: 001
contenttypeFulltext


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