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contributor authorTadahiro Shibutani
contributor authorQiang Yu
contributor authorMasaki Shiratori
date accessioned2017-05-09T00:23:28Z
date available2017-05-09T00:23:28Z
date copyrightMarch, 2007
date issued2007
identifier issn1528-9044
identifier otherJEPAE4-26272#71_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/135588
description abstractAs the shrinkage and integration of devices, the creep behavior of tin-based alloys becomes important with microscales. In this paper, the behavior of creep deformation in solder alloys during a nanoindentation test was examined. Nanoindentation creep test was carried out for tin-based solder balls. Obtained results summarized as follows: (i) The stress exponent for power-law creep estimated can be evaluated from the evolution of hardness. These values obtained in the early stage corresponds with that of bulk within the range of high strain rate. (ii) The stress sensitivity decreases after stress relaxation in nanoindentation creep tests. The saturated value is 1 in three solder balls. (iii) The morphology of indented surface consists of three parts: initial indentation, power-law creep, and granular surface. It suggests that the transition from power-law creep to diffusion creep takes place. (iv) Finite element method analysis reveals stress and strain concentration appears in the vicinity of the tip. Strain field remains self-similar as the indentation proceeds. (v) The gradient of triaxial stresses below the tip in a nanoindentation test accelerates the creep strain rate due to the diffusive flow, relatively.
publisherThe American Society of Mechanical Engineers (ASME)
titleA Study of Deformation Mechanism During Nanoindentation Creep in Tin-Based Solder Balls
typeJournal Paper
journal volume129
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2429712
journal fristpage71
journal lastpage75
identifier eissn1043-7398
keywordsSolders
keywordsStress
keywordsNanoindentation
keywordsCreep
keywordsDeformation
keywordsMechanisms AND Diffusion (Physics)
treeJournal of Electronic Packaging:;2007:;volume( 129 ):;issue: 001
contenttypeFulltext


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