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contributor authorGang Duan
contributor authorKai-Tak Wan
date accessioned2017-05-09T00:22:24Z
date available2017-05-09T00:22:24Z
date copyrightSeptember, 2007
date issued2007
identifier issn0021-8936
identifier otherJAMCAV-26656#927_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/135062
description abstractA thin one-dimensional rectangular or two-dimensional axisymmetric film is clamped at the perimeter. An electrostatic potential (V0*) applied to a pad directly underneath the film leads to a “pull-in” phenomenon. The electromagnetic energy stored in the capacitive film-pad dielectric gap is decoupled from the mechanical deformation of the film using the Dugdale-Barenblatt-Maugis cohesive zone approximation. The ratio of film-pad gap (g) to film thickness (h), or, γ=g∕h, is found to play a crucial role in the electromechanical behavior of the film. Solution spanning a wide range of γ is found such that V0*∝γ3∕2 for γ<0.5 and V0*∝γ5∕2 for γ>5. The new model leads to new design criteria for MEMS-RF-switches.
publisherThe American Society of Mechanical Engineers (ASME)
titleAnalysis of One-Dimensional and Two-Dimensional Thin Film “Pull-in” Phenomena Under the Influence of an Electrostatic Potential
typeJournal Paper
journal volume74
journal issue5
journal titleJournal of Applied Mechanics
identifier doi10.1115/1.2722311
journal fristpage927
journal lastpage934
identifier eissn1528-9036
treeJournal of Applied Mechanics:;2007:;volume( 074 ):;issue: 005
contenttypeFulltext


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