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    Ray Based Model for the Ultrasonic Time-of-Flight Diffraction Simulation of Thin Walled Structure Inspection

    Source: Journal of Pressure Vessel Technology:;2005:;volume( 127 ):;issue: 003::page 262
    Author:
    G. Baskaran
    ,
    K. Balasubramaniam
    ,
    C. V. Krishnamurthy
    ,
    C. Lakshmana Rao
    DOI: 10.1115/1.1989353
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: It is necessary to size the cracklike defects accurately in order to extend the life of thin-walled (<10mm) components (such as pressure vessels) particularly for aerospace applications. This paper discusses the successful application of ray techniques to simulate the ultrasonic time-of-flight diffraction experiments for platelike structures. For the simulation, the diffraction coefficients are computed using the geometric diffraction theory. The A and B scans are simulated in near real time and the different experimental parameters can be interactively controlled due to the computational efficiency of the ray technique. The simulated results are applied to (1) defect signal identification for vertical defects, (2) inspection of inclined defects, and (3) study the effect of pulse width or probe frequency on experimental results. The simulated results are compared with laboratory scale experimental results.
    keyword(s): Diffraction , Inspection , Product quality , Simulation , Probes , Signals , Flight , Pressure vessels , Waves AND Echoes ,
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      Ray Based Model for the Ultrasonic Time-of-Flight Diffraction Simulation of Thin Walled Structure Inspection

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/132497
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    contributor authorG. Baskaran
    contributor authorK. Balasubramaniam
    contributor authorC. V. Krishnamurthy
    contributor authorC. Lakshmana Rao
    date accessioned2017-05-09T00:17:35Z
    date available2017-05-09T00:17:35Z
    date copyrightAugust, 2005
    date issued2005
    identifier issn0094-9930
    identifier otherJPVTAS-28457#262_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/132497
    description abstractIt is necessary to size the cracklike defects accurately in order to extend the life of thin-walled (<10mm) components (such as pressure vessels) particularly for aerospace applications. This paper discusses the successful application of ray techniques to simulate the ultrasonic time-of-flight diffraction experiments for platelike structures. For the simulation, the diffraction coefficients are computed using the geometric diffraction theory. The A and B scans are simulated in near real time and the different experimental parameters can be interactively controlled due to the computational efficiency of the ray technique. The simulated results are applied to (1) defect signal identification for vertical defects, (2) inspection of inclined defects, and (3) study the effect of pulse width or probe frequency on experimental results. The simulated results are compared with laboratory scale experimental results.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleRay Based Model for the Ultrasonic Time-of-Flight Diffraction Simulation of Thin Walled Structure Inspection
    typeJournal Paper
    journal volume127
    journal issue3
    journal titleJournal of Pressure Vessel Technology
    identifier doi10.1115/1.1989353
    journal fristpage262
    journal lastpage268
    identifier eissn1528-8978
    keywordsDiffraction
    keywordsInspection
    keywordsProduct quality
    keywordsSimulation
    keywordsProbes
    keywordsSignals
    keywordsFlight
    keywordsPressure vessels
    keywordsWaves AND Echoes
    treeJournal of Pressure Vessel Technology:;2005:;volume( 127 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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