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contributor authorG. Baskaran
contributor authorK. Balasubramaniam
contributor authorC. V. Krishnamurthy
contributor authorC. Lakshmana Rao
date accessioned2017-05-09T00:17:35Z
date available2017-05-09T00:17:35Z
date copyrightAugust, 2005
date issued2005
identifier issn0094-9930
identifier otherJPVTAS-28457#262_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/132497
description abstractIt is necessary to size the cracklike defects accurately in order to extend the life of thin-walled (<10mm) components (such as pressure vessels) particularly for aerospace applications. This paper discusses the successful application of ray techniques to simulate the ultrasonic time-of-flight diffraction experiments for platelike structures. For the simulation, the diffraction coefficients are computed using the geometric diffraction theory. The A and B scans are simulated in near real time and the different experimental parameters can be interactively controlled due to the computational efficiency of the ray technique. The simulated results are applied to (1) defect signal identification for vertical defects, (2) inspection of inclined defects, and (3) study the effect of pulse width or probe frequency on experimental results. The simulated results are compared with laboratory scale experimental results.
publisherThe American Society of Mechanical Engineers (ASME)
titleRay Based Model for the Ultrasonic Time-of-Flight Diffraction Simulation of Thin Walled Structure Inspection
typeJournal Paper
journal volume127
journal issue3
journal titleJournal of Pressure Vessel Technology
identifier doi10.1115/1.1989353
journal fristpage262
journal lastpage268
identifier eissn1528-8978
keywordsDiffraction
keywordsInspection
keywordsProduct quality
keywordsSimulation
keywordsProbes
keywordsSignals
keywordsFlight
keywordsPressure vessels
keywordsWaves AND Echoes
treeJournal of Pressure Vessel Technology:;2005:;volume( 127 ):;issue: 003
contenttypeFulltext


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