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contributor authorTong Hong Wang
contributor authorYi-Shao Lai
date accessioned2017-05-09T00:15:53Z
date available2017-05-09T00:15:53Z
date copyrightJune, 2005
date issued2005
identifier issn1528-9044
identifier otherJEPAE4-26243#135_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/131652
description abstractIn a finite element analysis, when localized behavior of a large model is of particular concern, generally one would refine the mesh until it captures the local solution adequately. Submodeling is an alternative way for solving this kind of problem. It provides a relatively accurate solution at a modest computational cost. For a valid submodeling analysis, the boundaries of the submodel should be sufficiently far away from local features so that St. Venant’s principle holds. Moreover, special treatments are required for solving problems that involve path-dependent characteristics. This paper presents a general procedure to perform submodeling analyses for path-dependent thermomechanical problems without a priori assumptions on the structural response. The procedure was benchmarked using a bimaterial strip and demonstrated through analyses on a bump chip carrier package assembly. The procedure is conducive to the numerical assessment of fatigue lives of electronic packages.
publisherThe American Society of Mechanical Engineers (ASME)
titleSubmodeling Analysis for Path-Dependent Thermomechanical Problems
typeJournal Paper
journal volume127
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1869513
journal fristpage135
journal lastpage140
identifier eissn1043-7398
keywordsSolders
keywordsStress
keywordsFinite element analysis
keywordsFatigue life
keywordsStrips
keywordsElectronic packages
keywordsFatigue
keywordsAlloys
keywordsManufacturing
keywordsModeling
keywordsTemperature
keywordsSolder joints
keywordsSilicon AND Constitutive equations
treeJournal of Electronic Packaging:;2005:;volume( 127 ):;issue: 002
contenttypeFulltext


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