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    Deformation and Failure in Thin Films/Substrate Systems: Methods of Theoretical Analysis

    Source: Applied Mechanics Reviews:;2005:;volume( 058 ):;issue: 005::page 338
    Author:
    Leon L. Mishnaevsky
    ,
    Dietmar Gross
    DOI: 10.1115/1.1995717
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper reviews the theoretical models and methods of analysis of deformation, damage and fracture in thin film/substrate systems. The mechanisms and models of the plastic deformation of thin films, as well as the effects of the dislocation formation and movement on the strength and deformation of thin films are reviewed. The concepts and methods of the theoretical and numerical analysis of the crack propagation in thin films are discussed. The mechanisms and models of cracking, decohesion and delamination, the effects of the substrate properties, as well as of cracking in a thin film between two substrates are analyzed. Continuum mechanical, probabilistic, and lattice models of damage evolution in brittle thin films, the fragmentation of thin films on a substrate, and the formation of the crack patterns are reviewed as well. Numerical models of nanoindentation are discussed. This review article contains 106 references.
    keyword(s): Thin films , Deformation , Fracture (Process) , Mechanisms , Stress AND Dislocations ,
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      Deformation and Failure in Thin Films/Substrate Systems: Methods of Theoretical Analysis

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/131110
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    contributor authorLeon L. Mishnaevsky
    contributor authorDietmar Gross
    date accessioned2017-05-09T00:14:55Z
    date available2017-05-09T00:14:55Z
    date copyrightSeptember, 2005
    date issued2005
    identifier issn0003-6900
    identifier otherAMREAD-25859#338_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/131110
    description abstractThis paper reviews the theoretical models and methods of analysis of deformation, damage and fracture in thin film/substrate systems. The mechanisms and models of the plastic deformation of thin films, as well as the effects of the dislocation formation and movement on the strength and deformation of thin films are reviewed. The concepts and methods of the theoretical and numerical analysis of the crack propagation in thin films are discussed. The mechanisms and models of cracking, decohesion and delamination, the effects of the substrate properties, as well as of cracking in a thin film between two substrates are analyzed. Continuum mechanical, probabilistic, and lattice models of damage evolution in brittle thin films, the fragmentation of thin films on a substrate, and the formation of the crack patterns are reviewed as well. Numerical models of nanoindentation are discussed. This review article contains 106 references.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleDeformation and Failure in Thin Films/Substrate Systems: Methods of Theoretical Analysis
    typeJournal Paper
    journal volume58
    journal issue5
    journal titleApplied Mechanics Reviews
    identifier doi10.1115/1.1995717
    journal fristpage338
    journal lastpage353
    identifier eissn0003-6900
    keywordsThin films
    keywordsDeformation
    keywordsFracture (Process)
    keywordsMechanisms
    keywordsStress AND Dislocations
    treeApplied Mechanics Reviews:;2005:;volume( 058 ):;issue: 005
    contenttypeFulltext
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