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contributor authorLeon L. Mishnaevsky
contributor authorDietmar Gross
date accessioned2017-05-09T00:14:55Z
date available2017-05-09T00:14:55Z
date copyrightSeptember, 2005
date issued2005
identifier issn0003-6900
identifier otherAMREAD-25859#338_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/131110
description abstractThis paper reviews the theoretical models and methods of analysis of deformation, damage and fracture in thin film/substrate systems. The mechanisms and models of the plastic deformation of thin films, as well as the effects of the dislocation formation and movement on the strength and deformation of thin films are reviewed. The concepts and methods of the theoretical and numerical analysis of the crack propagation in thin films are discussed. The mechanisms and models of cracking, decohesion and delamination, the effects of the substrate properties, as well as of cracking in a thin film between two substrates are analyzed. Continuum mechanical, probabilistic, and lattice models of damage evolution in brittle thin films, the fragmentation of thin films on a substrate, and the formation of the crack patterns are reviewed as well. Numerical models of nanoindentation are discussed. This review article contains 106 references.
publisherThe American Society of Mechanical Engineers (ASME)
titleDeformation and Failure in Thin Films/Substrate Systems: Methods of Theoretical Analysis
typeJournal Paper
journal volume58
journal issue5
journal titleApplied Mechanics Reviews
identifier doi10.1115/1.1995717
journal fristpage338
journal lastpage353
identifier eissn0003-6900
keywordsThin films
keywordsDeformation
keywordsFracture (Process)
keywordsMechanisms
keywordsStress AND Dislocations
treeApplied Mechanics Reviews:;2005:;volume( 058 ):;issue: 005
contenttypeFulltext


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