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contributor authorSeungmin Cho
contributor authorJinwon Joo
contributor authorBongtae Han
date accessioned2017-05-09T00:12:45Z
date available2017-05-09T00:12:45Z
date copyrightMarch, 2004
date issued2004
identifier issn1528-9044
identifier otherJEPAE4-26228#41_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129885
description abstractA robust scheme of moiré interferometry for real-time observation is employed to study the temperature dependent thermo-mechanical behavior of a ceramic ball grid array package assembly. The scheme is implemented with a convection-type environmental chamber that provides the rapid temperature control required in accelerated thermal cycling. Thermal deformations are documented at various temperatures. Thermal-history dependent analyses of global and local deformations are presented. A significant nonlinear global behavior is documented due to complete stress relaxation at the maximum temperature. An analysis of solder interconnections reveals that inelastic deformation accumulates at the bottom eutectic solder fillet only at high temperatures.
publisherThe American Society of Mechanical Engineers (ASME)
titleTemperature Dependent Deformation Analysis of Ceramic Ball Grid Array Package Assembly Under Accelerated Thermal Cycling Condition
typeJournal Paper
journal volume126
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1646426
journal fristpage41
journal lastpage47
identifier eissn1043-7398
keywordsDeformation
keywordsTemperature
keywordsCeramics
keywordsInterferometry
keywordsSolders
keywordsManufacturing
keywordsBall-Grid-Array packaging
keywordsStress AND Displacement
treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001
contenttypeFulltext


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