| contributor author | Jingsong Xie | |
| contributor author | Ming Sun | |
| contributor author | Michael Pecht | |
| contributor author | David F. Barbe | |
| date accessioned | 2017-05-09T00:12:45Z | |
| date available | 2017-05-09T00:12:45Z | |
| date copyright | March, 2004 | |
| date issued | 2004 | |
| identifier issn | 1528-9044 | |
| identifier other | JEPAE4-26228#37_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/129884 | |
| description abstract | Most connectors are made from copper or copper alloys, with beryllium copper and phosphor bronze being the most common base materials due to their high electrical conductivity, low stress relaxation, and competitive cost. The most significant drawback is copper’s low resistance to corrosion, which can lead to electrical failure of connectors. For this reason, a layer of gold is often plated on the surfaces of connectors to seal off the base metal from being directly exposed to the environment. As an economical practice, gold flashing has been used to protect electrical contacts from corrosion. However, there is increasing evidence indicating that gold flashing can be detrimental in applications calling for long-term reliability. This paper provides insight into reliability issues of gold flash. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Why Gold Flash Can Be Detrimental to Long-Term Reliability | |
| type | Journal Paper | |
| journal volume | 126 | |
| journal issue | 1 | |
| journal title | Journal of Electronic Packaging | |
| identifier doi | 10.1115/1.1646425 | |
| journal fristpage | 37 | |
| journal lastpage | 40 | |
| identifier eissn | 1043-7398 | |
| keywords | Reliability AND Corrosion | |
| tree | Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001 | |
| contenttype | Fulltext | |
