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contributor authorHector Perez
contributor authorQingze Zou
contributor authorSantosh Devasia
date accessioned2017-05-09T00:12:39Z
date available2017-05-09T00:12:39Z
date copyrightMarch, 2004
date issued2004
identifier issn0022-0434
identifier otherJDSMAA-26327#187_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129818
description abstractThis article addresses the optimal (minimal input energy) design of scan trajectories, which is important in applications such as the imaging and manipulation of nano-scale surface phenomena using scanning tunneling microscopes (STM), MEMS-based micro-scanners, quick-return mechanisms and cams used in manufacturing, and general repeating processes. The contribution of this article is the systematic solution of the optimal scan-trajectory design problem. As opposed to existing techniques that require pre-specification of the desired output trajectory (such prespecifications can be ad hoc), the optimal output trajectory is found as a result of the proposed input-energy minimization approach. In this sense, the proposed approach leads to a systematic solution of the optimal output-trajectory-design problem. The proposed optimal scanning method is applied to an experimental scanning tunneling microscope; simulation and experimental results are presented to illustrate the efficacy of the proposed approach to design optimal scan-trajectories.
publisherThe American Society of Mechanical Engineers (ASME)
titleDesign and Control of Optimal Scan Trajectories: Scanning Tunneling Microscope Example
typeJournal Paper
journal volume126
journal issue1
journal titleJournal of Dynamic Systems, Measurement, and Control
identifier doi10.1115/1.1636770
journal fristpage187
journal lastpage197
identifier eissn1528-9028
keywordsScanning tunneling microscopy
keywordsTrajectories (Physics)
keywordsDesign
keywordsImaging
keywordsSimulation
keywordsDynamics (Mechanics) AND Boundary-value problems
treeJournal of Dynamic Systems, Measurement, and Control:;2004:;volume( 126 ):;issue: 001
contenttypeFulltext


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