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contributor authorC. M. Lawrence Wu
contributor authorRobert K. Y. Li
contributor authorN. H. Yeung
date accessioned2017-05-09T00:07:13Z
date available2017-05-09T00:07:13Z
date copyrightDecember, 2002
date issued2002
identifier issn1528-9044
identifier otherJEPAE4-26210#374_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/126639
description abstractIsotropic conductive adhesives (ICA) have been considered as replacement materials for lead-tin solder alloys. In this paper, the post-impact shear strength of ICA surface mount (SM) joints was obtained experimentally and compared with that of SM lead-tin joints. The dynamic impact energy was provided in the form of three-point bending on the PCB using equipment called the split Hopkinson bar. Strain rates of over 4000/s were used for the impact bending test. The action of impact bending was used to simulate the effect on the PCB and the interconnection as a result of high energy impact on an electronic equipment. Shear test was then performed to examine the change in strength of the ICA joints as a result of impact damage. It was found that the SM ICA joints failed due to impact at a strain rate just over 4000/s. Microstructural examination carried out using a scanning electron microscope revealed that the interface between the ICA and copper pad on the PCB was the weakest region of the joint.
publisherThe American Society of Mechanical Engineers (ASME)
titleImpact Resistance of SM Joints Formed With ICA
typeJournal Paper
journal volume124
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1502666
journal fristpage374
journal lastpage378
identifier eissn1043-7398
keywordsCopper
keywordsSilver
keywordsAlloys
keywordsAdhesives
keywordsScanning electron microscopes
keywordsSolders
keywordsElectrical resistance
keywordsShear (Mechanics)
keywordsShear strength
keywordsSurface mount packaging
keywordsFracture (Process)
keywordsResistors
keywordsStress
keywordsReliability
keywordsCompression
keywordsElectronic equipment
keywordsBonding
keywordsCuring
keywordsImpact testing
keywordsResins AND Temperature
treeJournal of Electronic Packaging:;2002:;volume( 124 ):;issue: 004
contenttypeFulltext


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