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contributor authorQizhou Yao
contributor authorJianmin Qu
date accessioned2017-05-09T00:07:11Z
date available2017-05-09T00:07:11Z
date copyrightJune, 2002
date issued2002
identifier issn1528-9044
identifier otherJEPAE4-26203#127_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/126617
description abstractDebonding of polymer-metal interfaces often involves both interfacial and cohesive failure. Since the cohesive strength of polymers is usually much greater than the polymer-metal interfacial strength, cohesive failure near the interface is usually desired for enhancing the interfacial adhesion. Roughened surfaces generally produce more cohesive failure; therefore, they are used commonly in practice to obtain better adhesion. This paper develops a fracture mechanics model that can be used to quantitatively predict the amount of cohesive failure once the surface roughness data are given. An epoxy/Al interface was investigated using this fracture mechanics model. The predicted amount of cohesive failure as a function of surface roughness compares very well with the experimentally measured values. It is believed that this model can be extended to other polymer–metal interfaces. Contributed by the Electronic and Photonic Packaging Division for publication in the JOURNAL OF ELECTRONIC PACKAGING . Manuscript received by the EPPD.
publisherThe American Society of Mechanical Engineers (ASME)
titleInterfacial Versus Cohesive Failure on Polymer-Metal Interfaces in Electronic Packaging—Effects of Interface Roughness
typeJournal Paper
journal volume124
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1459470
journal fristpage127
journal lastpage134
identifier eissn1043-7398
keywordsMetals
keywordsElectronic packaging
keywordsSurface roughness
keywordsFracture (Materials)
keywordsPolymers
keywordsFailure
keywordsEpoxy adhesives
keywordsInterface roughness AND Aluminum
treeJournal of Electronic Packaging:;2002:;volume( 124 ):;issue: 002
contenttypeFulltext


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