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    On the Modal Testing of Microstructures: Its Theoretical Approach and Experimental Setup

    Source: Journal of Vibration and Acoustics:;2001:;volume( 123 ):;issue: 001::page 104
    Author:
    Yuan-Fang Chou
    ,
    Li-Chung Wang
    DOI: 10.1115/1.1320814
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Small and lightweight structures have very high natural frequencies and small elastic displacement compared to ordinary structures. Due to limited excitation bandwidth and relatively large size of pick up devices, conventional modal testing facilities are not feasible for testing MEMS structures. A modal testing system based on the base excitation principle was developed in this research. In the meantime, the associated mathematical model for frequency response functions was derived as well. Testing structures are mounted on a rigid platform that can move essentially with only one translational degree of freedom. An electric discharge pulse strikes the platform to provide a very wide band excitation. Laser Doppler vibrometers are used to pick up both input and output signals. Since these signals are picked up without contacting structures, the structural dynamic characteristics remain intact without any distortion. With this system, modal parameters of a miniature structure can be extracted, and the receptance functions are synthesized successfully.
    keyword(s): Testing , Functions , Frequency response , Displacement , Electric discharge , Laser Doppler vibrometers , Force AND Frequency ,
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      On the Modal Testing of Microstructures: Its Theoretical Approach and Experimental Setup

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    http://yetl.yabesh.ir/yetl1/handle/yetl/126170
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    contributor authorYuan-Fang Chou
    contributor authorLi-Chung Wang
    date accessioned2017-05-09T00:06:27Z
    date available2017-05-09T00:06:27Z
    date copyrightJanuary, 2001
    date issued2001
    identifier issn1048-9002
    identifier otherJVACEK-28855#104_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/126170
    description abstractSmall and lightweight structures have very high natural frequencies and small elastic displacement compared to ordinary structures. Due to limited excitation bandwidth and relatively large size of pick up devices, conventional modal testing facilities are not feasible for testing MEMS structures. A modal testing system based on the base excitation principle was developed in this research. In the meantime, the associated mathematical model for frequency response functions was derived as well. Testing structures are mounted on a rigid platform that can move essentially with only one translational degree of freedom. An electric discharge pulse strikes the platform to provide a very wide band excitation. Laser Doppler vibrometers are used to pick up both input and output signals. Since these signals are picked up without contacting structures, the structural dynamic characteristics remain intact without any distortion. With this system, modal parameters of a miniature structure can be extracted, and the receptance functions are synthesized successfully.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleOn the Modal Testing of Microstructures: Its Theoretical Approach and Experimental Setup
    typeJournal Paper
    journal volume123
    journal issue1
    journal titleJournal of Vibration and Acoustics
    identifier doi10.1115/1.1320814
    journal fristpage104
    journal lastpage109
    identifier eissn1528-8927
    keywordsTesting
    keywordsFunctions
    keywordsFrequency response
    keywordsDisplacement
    keywordsElectric discharge
    keywordsLaser Doppler vibrometers
    keywordsForce AND Frequency
    treeJournal of Vibration and Acoustics:;2001:;volume( 123 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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