contributor author | Y. Wei | |
contributor author | H. E. Fang | |
contributor author | M. K. Neilsen | |
contributor author | C. L. Chow | |
date accessioned | 2017-05-09T00:04:36Z | |
date available | 2017-05-09T00:04:36Z | |
date copyright | September, 2001 | |
date issued | 2001 | |
identifier issn | 1528-9044 | |
identifier other | JEPAE4-26195#278_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/125041 | |
description abstract | This paper presents a viscoplasticity model taking into account the effects of change in grain or phase size and damage on the characterization of creep damage in 60 Sn-40 Pb solder. Based on the theory of damage mechanics, a two-scalar damage model is developed for isotropic materials by introducing the free energy equivalence principle. The damage evolution equations are derived in terms of the damage energy release rates. In addition, a failure criterion is developed based on the postulation that a material element is said to have ruptured when the equivalent damage accumulated in the element reaches a critical value. The damage coupled viscoplasticity model is discretized and coded in a general-purpose finite element program known as ABAQUS through its user-defined material subroutine UMAT. To illustrate the application of the model, several example cases are introduced to analyze, both numerically and experimentally, the tensile creep behaviors of the material at three stress levels. The model is then applied to predict the deformation of a notched specimen under monotonic tension at room temperature (22°C). The results demonstrate that the proposed model can successfully predict the viscoplastic behavior of the solder material. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Characteristics of Creep Damage for 60 Sn-40 Pb Solder Material | |
type | Journal Paper | |
journal volume | 123 | |
journal issue | 3 | |
journal title | Journal of Electronic Packaging | |
identifier doi | 10.1115/1.1372319 | |
journal fristpage | 278 | |
journal lastpage | 283 | |
identifier eissn | 1043-7398 | |
keywords | Creep | |
keywords | Temperature | |
keywords | Solders | |
keywords | Stress | |
keywords | Equations | |
keywords | Tension | |
keywords | Tensors | |
keywords | Viscoplasticity | |
keywords | Finite element analysis | |
keywords | Constitutive equations | |
keywords | Scalars | |
keywords | Deformation AND Failure | |
tree | Journal of Electronic Packaging:;2001:;volume( 123 ):;issue: 003 | |
contenttype | Fulltext | |