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contributor authorXiangcheng Luo
contributor authorYunsheng Xu
contributor authorD. D. L. Chung
date accessioned2017-05-09T00:04:34Z
date available2017-05-09T00:04:34Z
date copyrightSeptember, 2001
date issued2001
identifier issn1528-9044
identifier otherJEPAE4-26195#309_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/125022
description abstractThermal interface pastes based on silicone, lithium doped polyethylene glycol (PEG), and sodium silicate were evaluated in their performance before and after heating up to 120°C. The thermal contact conductance of any of the pastes between copper disks decreased after heating, such that the fractional decrease was less for the silicone-based paste than the PEG-based and sodium-silicate-based pastes. Nevertheless, the conductance was lower for the silicone-based paste than the other pastes both before and after heating up to 100 cycles.
publisherThe American Society of Mechanical Engineers (ASME)
titleThermal Stability of Thermal Interface Pastes, Evaluated by Thermal Contact Conductance Measurement
typeJournal Paper
journal volume123
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1371925
journal fristpage309
journal lastpage311
identifier eissn1043-7398
keywordsCopper
keywordsElectrical conductance
keywordsDisks
keywordsCycles
keywordsSilicones
keywordsSodium
keywordsThermal stability
keywordsHeating
keywordsContact resistance
keywordsLithium AND Temperature
treeJournal of Electronic Packaging:;2001:;volume( 123 ):;issue: 003
contenttypeFulltext


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