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contributor authorRon S. Li
date accessioned2017-05-09T00:04:33Z
date available2017-05-09T00:04:33Z
date copyrightDecember, 2001
date issued2001
identifier issn1528-9044
identifier otherJEPAE4-26198#394_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/125009
description abstractIn modern automotive control modules, mechanical failures of surface mounted electronic components such as microprocessors, crystals, capacitors, transformers, inductors, and ball grid array packages, etc., are major roadblocks to design cycle time and product reliability. This paper presents a general methodology of failure analysis and fatigue prediction of these electronic components under automotive vibration environments. Mechanical performance of these packages is studied through finite element modeling approach for given vibration environments in automotive application. The vibration simulation provides system characteristics such as modal shapes and transfer functions, and dynamic responses including displacements, accelerations, and stresses. The system level model is correlated through vibration experiments. Using the results of vibration simulation, fatigue life is predicted based on cumulative damage analysis and material durability information. Detailed model of solder/lead joints is built to correlate the system level model and obtain solder stresses. Predicted failure mechanism of the leads agrees with the experiment observation. On the test vehicle with multiple components, one of the 160-pin gull-wing lead plastic quad flat packages was chosen as an example to illustrate the approach of failure analysis and fatigue life prediction.
publisherThe American Society of Mechanical Engineers (ASME)
titleA Methodology for Fatigue Prediction of Electronic Components Under Random Vibration Load
typeJournal Paper
journal volume123
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1372318
journal fristpage394
journal lastpage400
identifier eissn1043-7398
keywordsFatigue
keywordsStress
keywordsElectronic components
keywordsFinite element analysis
keywordsDesign
keywordsFailure mechanisms
keywordsRandom vibration
keywordsVibration
keywordsModeling
keywordsSolders
keywordsCycles
keywordsFailure
keywordsFatigue life AND Electronic packaging
treeJournal of Electronic Packaging:;2001:;volume( 123 ):;issue: 004
contenttypeFulltext


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