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    Interfacial Fluid Mechanics and Pressure Prediction in Chemical Mechanical Polishing

    Source: Journal of Tribology:;2000:;volume( 122 ):;issue: 003::page 539
    Author:
    Lei Shan
    ,
    John Tichy
    ,
    Steven Danyluk
    ,
    Joseph Levert
    ,
    Lorne Meade
    DOI: 10.1115/1.555398
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper reports on the measurement of fluid (water) pressure distribution at a soft (polyurethane) pad/steel interface. The distribution of the interfacial fluid pressure has been measured with a specially-designed fixture over the typical range of normal loads and velocities used in the chemical mechanical polishing/planarization of silicon wafers. The results show that, for most cases, the leading two-thirds of the fixture exhibits a subambient pressure, and the trailing third a positive pressure. The average pressure is sub-ambient and may be of the order of 50∼100% of the normal load applied. An analytical model has been developed to predict the magnitude and distribution of the interfacial fluid pressure. The predictions of this model fit the experimental results reasonably well, especially for low sliding velocities. [S0742-4787(00)00902-4]
    keyword(s): Pressure , Fluid pressure , Stress , Polishing , Jigs and fixtures , Semiconductor wafers , Surface roughness , Fluid mechanics AND Urethane elastomers ,
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      Interfacial Fluid Mechanics and Pressure Prediction in Chemical Mechanical Polishing

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    http://yetl.yabesh.ir/yetl1/handle/yetl/124335
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    contributor authorLei Shan
    contributor authorJohn Tichy
    contributor authorSteven Danyluk
    contributor authorJoseph Levert
    contributor authorLorne Meade
    date accessioned2017-05-09T00:03:25Z
    date available2017-05-09T00:03:25Z
    date copyrightJuly, 2000
    date issued2000
    identifier issn0742-4787
    identifier otherJOTRE9-28690#539_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/124335
    description abstractThis paper reports on the measurement of fluid (water) pressure distribution at a soft (polyurethane) pad/steel interface. The distribution of the interfacial fluid pressure has been measured with a specially-designed fixture over the typical range of normal loads and velocities used in the chemical mechanical polishing/planarization of silicon wafers. The results show that, for most cases, the leading two-thirds of the fixture exhibits a subambient pressure, and the trailing third a positive pressure. The average pressure is sub-ambient and may be of the order of 50∼100% of the normal load applied. An analytical model has been developed to predict the magnitude and distribution of the interfacial fluid pressure. The predictions of this model fit the experimental results reasonably well, especially for low sliding velocities. [S0742-4787(00)00902-4]
    publisherThe American Society of Mechanical Engineers (ASME)
    titleInterfacial Fluid Mechanics and Pressure Prediction in Chemical Mechanical Polishing
    typeJournal Paper
    journal volume122
    journal issue3
    journal titleJournal of Tribology
    identifier doi10.1115/1.555398
    journal fristpage539
    journal lastpage543
    identifier eissn1528-8897
    keywordsPressure
    keywordsFluid pressure
    keywordsStress
    keywordsPolishing
    keywordsJigs and fixtures
    keywordsSemiconductor wafers
    keywordsSurface roughness
    keywordsFluid mechanics AND Urethane elastomers
    treeJournal of Tribology:;2000:;volume( 122 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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