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contributor authorLei Shan
contributor authorJohn Tichy
contributor authorSteven Danyluk
contributor authorJoseph Levert
contributor authorLorne Meade
date accessioned2017-05-09T00:03:25Z
date available2017-05-09T00:03:25Z
date copyrightJuly, 2000
date issued2000
identifier issn0742-4787
identifier otherJOTRE9-28690#539_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/124335
description abstractThis paper reports on the measurement of fluid (water) pressure distribution at a soft (polyurethane) pad/steel interface. The distribution of the interfacial fluid pressure has been measured with a specially-designed fixture over the typical range of normal loads and velocities used in the chemical mechanical polishing/planarization of silicon wafers. The results show that, for most cases, the leading two-thirds of the fixture exhibits a subambient pressure, and the trailing third a positive pressure. The average pressure is sub-ambient and may be of the order of 50∼100% of the normal load applied. An analytical model has been developed to predict the magnitude and distribution of the interfacial fluid pressure. The predictions of this model fit the experimental results reasonably well, especially for low sliding velocities. [S0742-4787(00)00902-4]
publisherThe American Society of Mechanical Engineers (ASME)
titleInterfacial Fluid Mechanics and Pressure Prediction in Chemical Mechanical Polishing
typeJournal Paper
journal volume122
journal issue3
journal titleJournal of Tribology
identifier doi10.1115/1.555398
journal fristpage539
journal lastpage543
identifier eissn1528-8897
keywordsPressure
keywordsFluid pressure
keywordsStress
keywordsPolishing
keywordsJigs and fixtures
keywordsSemiconductor wafers
keywordsSurface roughness
keywordsFluid mechanics AND Urethane elastomers
treeJournal of Tribology:;2000:;volume( 122 ):;issue: 003
contenttypeFulltext


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