| contributor author | Ephraim Suhir | |
| contributor author | Anthony J. Rafanelli | |
| contributor author | Mitsuo Fukuda | |
| contributor author | Charles R. Kurkjian | |
| date accessioned | 2017-05-08T23:59:23Z | |
| date available | 2017-05-08T23:59:23Z | |
| date copyright | March, 1999 | |
| date issued | 1999 | |
| identifier issn | 1528-9044 | |
| identifier other | JEPAE4-26171#55_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/122016 | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Reliability of Photonics Materials and Structures (Proceedings of the Reliability of Photonics Materials and Structures Symposium held April 13–16, 1998 in San Francisco, CA) | |
| type | Journal Paper | |
| journal volume | 121 | |
| journal issue | 1 | |
| journal title | Journal of Electronic Packaging | |
| identifier doi | 10.1115/1.2792662 | |
| journal fristpage | 55 | |
| identifier eissn | 1043-7398 | |
| keywords | Reliability AND Photonics | |
| tree | Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 001 | |
| contenttype | Fulltext | |
