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    Linear Relationships Between the Stress Fields of 〈111〉 Line Defects

    Source: Journal of Applied Mechanics:;1998:;volume( 065 ):;issue: 004::page 1064
    Author:
    Y. T. Chou
    ,
    Sanboh Lee
    DOI: 10.1115/1.2791904
    Publisher: The American Society of Mechanical Engineers (ASME)
    keyword(s): Product quality AND Stress ,
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      Linear Relationships Between the Stress Fields of 〈111〉 Line Defects

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    http://yetl.yabesh.ir/yetl1/handle/yetl/119820
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    contributor authorY. T. Chou
    contributor authorSanboh Lee
    date accessioned2017-05-08T23:55:30Z
    date available2017-05-08T23:55:30Z
    date copyrightDecember, 1998
    date issued1998
    identifier issn0021-8936
    identifier otherJAMCAV-26457#1064_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/119820
    publisherThe American Society of Mechanical Engineers (ASME)
    titleLinear Relationships Between the Stress Fields of 〈111〉 Line Defects
    typeJournal Paper
    journal volume65
    journal issue4
    journal titleJournal of Applied Mechanics
    identifier doi10.1115/1.2791904
    journal fristpage1064
    journal lastpage1066
    identifier eissn1528-9036
    keywordsProduct quality AND Stress
    treeJournal of Applied Mechanics:;1998:;volume( 065 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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