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contributor authorK. X. Hu
contributor authorY. Huang
contributor authorC. P. Yeh
contributor authorK. W. Wyatt
date accessioned2017-05-08T23:49:50Z
date available2017-05-08T23:49:50Z
date copyrightJune, 1996
date issued1996
identifier issn1528-9044
identifier otherJEPAE4-26154#87_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/116793
description abstractThe single most difficult aspect for thermo-mechanical analysis at the board level lies in to an accurate accounting for interactions among boards and small features such as solder joints and secondary components. It is the large number of small features populated in a close neighborhood that proliferates the computational intensity. This paper presents an approach to stress analysis for boards with highly populated small features (solder joints, for example). To this end, a generalized self-consistent method, utilizing an energy balance framework and a three-phase composite model, is developed to obtain the effective properties at board level. The stress distribution inside joints and components are obtained through a back substitution. The solutions presented are mostly in the closed-form and require a minimum computational effort. The results obtained by present approach are compared with those by finite element analysis. The numerical calculations show that the proposed micromechanics approach can provide reasonably accurate solutions for highly populated printed circuit boards.
publisherThe American Society of Mechanical Engineers (ASME)
titleStress Analysis of Printed Circuit Boards With Highly Populated Solder Joints and Components: A Micromechanics Approach
typeJournal Paper
journal volume118
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2792137
journal fristpage87
journal lastpage93
identifier eissn1043-7398
keywordsMicromechanics (Engineering)
keywordsStress analysis (Engineering)
keywordsSolder joints
keywordsPrinted circuit boards
keywordsLumber
keywordsComposite materials
keywordsEnergy budget (Physics)
keywordsStress concentration AND Finite element analysis
treeJournal of Electronic Packaging:;1996:;volume( 118 ):;issue: 002
contenttypeFulltext


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